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"Analyzing resistive-open defects in SRAM core-cell under the effect of ..."
Elena I. Vatajelu et al. (2013)
- Elena I. Vatajelu
, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri
, Arnaud Virazel
, Nabil Badereddine:
Analyzing resistive-open defects in SRAM core-cell under the effect of process variability. ETS 2013: 1-6

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