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"Analyzing resistive-open defects in SRAM core-cell under the effect of ..."

Elena I. Vatajelu et al. (2013)

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DOI: 10.1109/ETS.2013.6569373

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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  dblp key:
  - conf/ets/VatajeluBDGTVB13
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  persistent URL:
  - https://dblp.org/rec/conf/ets/VatajeluBDGTVB13
Elena I. Vatajelu, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine:
Analyzing resistive-open defects in SRAM core-cell under the effect of process variability. ETS 2013: 1-6

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