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"Test solution for data retention faults in low-power SRAMs."
Leonardo Bonet Zordan et al. (2013)
- Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine:
Test solution for data retention faults in low-power SRAMs. DATE 2013: 442-447
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