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"Effect-cause intra-cell diagnosis at transistor level."

Zhenzhou Sun et al. (2013)

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DOI: 10.1109/ISQED.2013.6523652

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-04

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  dblp key:
  - conf/isqed/SunBDGTVA13
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Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Etienne Auvray:
Effect-cause intra-cell diagnosis at transistor level. ISQED 2013: 460-467

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