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"A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching ..."

Joao Azevedo et al. (2014)

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DOI: 10.1109/TVLSI.2013.2294080

access: closed

type: Journal Article

metadata version: 2023-03-21

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  - https://dblp.org/rec/journals/tvlsi/AzevedoVBDGTAM14
Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Jérémy Alvarez-Herault, Ken Mackay:
A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs. IEEE Trans. Very Large Scale Integr. Syst. 22(11): 2326-2335 (2014)

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