15th DDECS 2012: Tallinn, Estonia

Keynote Talks

Embedded Tutorials

Poster Session I

Processor Architectures

Analog and RF Desing

NoC Simulation and Test

Analog, RF Design and Test

Fault Tolerance


Short Papers I

Short Papers II

Poster Session II


Test Generation and Fault Detection

Poster Session III

On-line Test and Self-Repair

Test and Reliability of Microprocessors

Design Verification

Reliability Challenges in Nano-Scale Technology

Physical Design

Industrial Papers

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