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ORCIDLi Chen 0001
Person information
- affiliation: University of Saskatchewan, Saskatoon, Canada
Other persons with the same name
- Li Chen — disambiguation page
- Li Chen 0002 — University of the District of Columbia, Washington, USA (and 1 more)
- Li Chen 0003 — Shantou University, Guangdong, China (and 1 more)
- Li Chen 0004 — Microsoft Corporation, Red Hills, Washington, USA (and 1 more)
- Li Chen 0005 — Anhui Normal University, Wuhu, China
- Li Chen 0006 — University of Mannheim, Germany
- Li Chen 0007 — Xiamen University, China
- Li Chen 0008
![[0000-0002-4228-7885]](https://dblp1.uni-trier.de/img/orcid-mark.12x12.png "0000-0002-4228-7885")
— Zhongguancun Laboratory, Beijing, China (and 1 more) - Li Chen 0009 — Hong Kong Baptist University, Department of Computer Science, Hong Kong (and 1 more)
- Li Chen 0010 — Hong Kong University of Science and Technology, Department of Mechanical and Aerospace Engineering, Hong Kong
- Li Chen 0011 — Wuhan University of Science and Technology, School of Computer Science and Technology, China (and 1 more)
- Li Chen 0012 — PLA University of Science & Technology, Institute of Command Automation, Nanjing, China
- Li Chen 0013 — Sun Yat-sen University, Guangzhou, China (and 1 more)
- Li Chen 0014 — Wenzhou Medical University, Department of Psychology, School of Environmental Science and Public Health, China
- Li Chen 0015 — University of Science and Technology of China, Department of Electronic Engineering and Information Science, Hefei, China
- Li Chen 0016 — Worcester Polytechnic Institute, Department of Computer Science, MA, USA
- Li Chen 0017 — Fujitsu R&D Center, Beijing, China
- Li Chen 0018 — Johns Hopkins University School of Medicine, Department of Pathology, Baltimore, MD, USA (and 2 more)
- Li Chen 0019 — University of Louisiana at Lafayette, School of Computing and Informatics, Department of Computer Science, Lafayette, LA, USA (and 1 more)
- Li Chen 0020 — University of Washington, Department of Electronic Engineering, Seattle, WA, USA (and 1 more)
- Li Chen 0021 — Shanghai Jiao Tong University, Department of Electronic Engineering, Institute of Image Communication and Network Engineering, China
- Li Chen 0022 — Rutgers University, Department of Chemistry and Chemical Biology, Piscataway, NJ, USA
- Chen Li 0015 (aka: Li Chen 0023) — National University of Defense Technology, Changsha, China
- Li Chen 0024 — Beijing University of Posts and Telecommunications, Wireless Theories and Technologies, China
- Li Chen 0025 — Central South University, School of Geosciences and Info-Physics, Changsha, China
- Li Chen 0026 — Southwest Jiaotong University, Faculty of Geosciences and Environmental Engineering, Chengdu, China
- Li Chen 0027 — University of California, San Diego, CA, USA
- Li Chen 0028 — Carnegie Mellon University, PA, USA (and 1 more)
- Li Chen 0029 — University of Florida, Department of Biostatistics, Gainesville, FL, USA (and 3 more)
- Li Chen 0030 — Cornell University, SC Johnson College of Business, Samuel Curtis Johnson Graduate School of Management, Ithaca, NY, USA
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2020 – today
- 2024
[j24]Ananda Sutradhar, Mustahsin Al Rafi, Pronab Ghosh, F. M. Javed Mehedi Shamrat, Md. Moniruzzaman, Kawsar Ahmed, A. K. M. Azad, Francis M. Bui, Li Chen, Mohammad Ali Moni:
An Intelligent Thyroid Diagnosis System Utilizing Multiple Ensemble and Explainable Algorithms With Medical Supported Attributes. IEEE Trans. Artif. Intell. 5(6): 2840-2855 (2024)- 2023
- [c17]Md Mamun Ali, Kawsar Ahmed, Francis M. Bui, Li Chen:
STACKION: Ion Channel-Modulating Peptides Identification Using Stacking-Based Ensemble Machine Learning. CCECE 2023: 216-221 - [c16]Md. Nazmul Hossen, Kawsar Ahmed, Francis M. Bui, Li Chen:
FedRSMax: An Effective Aggregation Technique for Federated Learning with Medical Images. CCECE 2023: 229-234 - 2021
- [j23]JianAn Wang, Xue Wu, Haonan Tian, Lixiang Li, Shuting Shi, Li Chen:
Radiation Tolerant SRAM Cell Design in 65nm Technology. J. Electron. Test. 37(2): 255-262 (2021) - [j22]Shuting Shi, Rui Chen, Rui Liu, Mo Chen, Chen Shen, Xuantian Li, Haonan Tian, Li Chen:
Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor. J. Electron. Test. 37(2): 271-278 (2021)
2010 – 2019
- 2019
- [j21]Haibin Wang, Xixi Dai, Younis Mohammed Younis Ibrahim, Hongwen Sun, Issam Nofal, Li Cai, Gang Guo, Zicai Shen, Li Chen:
A Layout-Based Rad-Hard DICE Flip-Flop Design. J. Electron. Test. 35(1): 111-117 (2019) - [c15]Jaime Cardenas, Abdul Khan, Li Chen, Zhichao Zhang, Muhammad Khan:
A Radiation-Tolerant CML Voltage Controlled Oscillator in 28nm CMOS FDSOI. CCECE 2019: 1-4 - [c14]Abdul Baseer Khan, Jaime Cardenas, Li Chen, Muhammad Raashid Khan, Aqeel Qureshi:
A Low Power and Low Noise Voltage-Controlled Oscillator in 28-nm FDSOI Technology for Wireless Communication Applications. CCECE 2019: 1-5 - 2018
- [j20]Yuanqing Li, Li Chen, Issam Nofal, Mo Chen, Haibin Wang, Rui Liu, Qingyu Chen, Milos Krstic, Shuting Shi, Gang Guo, Sang H. Baeg, Shi-Jie Wen, Richard Wong:
Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree. Microelectron. Reliab. 87: 24-32 (2018) - [j19]Haibin Wang, Xixi Dai, Yangsheng Wang, Issam Nofal, Li Cai, Zicai Shen, Wanxiu Sun, Jinshun Bi, Bo Li, Gang Guo, Li Chen, Sang H. Baeg:
A single event upset tolerant latch design. Microelectron. Reliab. 88-90: 909-913 (2018) - [c13]Zhichao Zhang, Li Chen, Hormoz Djahanshahi:
A Hardened-By-Design Technique for LC-Tank Voltage Controlled Oscillator. CCECE 2018: 1-4 - [c12]Zhichao Zhang, Li Chen, Hormoz Djahanshahi:
A SEE Insensitive CML Voltage Controlled Oscillator in 65nm CMOS. CCECE 2018: 1-4 - 2017
- [j18]Zhichao Zhang, Anh Dinh, Li Chen, Haibin Wang:
Wide range linearity improvement technique for linear wideband LNA. IEICE Electron. Express 14(4): 20170002 (2017) - [j17]Haibin Wang, Ao Sheng, Shiqi Wang, Jinshun Bi, Li Chen, Xiaofeng Liu:
SEU reduction effectiveness of common centroid layout in differential latch at 130-nm CMOS technology. Microelectron. Reliab. 72: 39-44 (2017) - [c11]Issam Nofal, Adrian Evans, Anlin He, Gang Guo, Yuanqing Li, Li Chen, Rui Liu, Haibin Wang, Mo Chen, Sang H. Baeg, Shi-Jie Wen, Richard Wong:
BPPT - Bulk potential protection technique for hardened sequentials. IOLTS 2017: 28-32 - 2016
- [j16]Yuanqing Li, Haibin Wang, Lixiang Li, Li Chen, Rui Liu, Mo Chen:
A Built-in Single Event Upsets Detector for Sequential Cells. J. Electron. Test. 32(1): 11-20 (2016) - [j15]Haibin Wang, Mulong Li, Xixi Dai, Shuting Shi, Li Chen, Gang Guo:
Layout-based Single Event Mitigation Techniques for Dynamic Logic Circuits. J. Electron. Test. 32(1): 97-103 (2016) - [j14]Yuanqing Li, Lixiang Li, Yuan Ma, Li Chen, Rui Liu, Haibin Wang, Qiong Wu, Michael Newton, Mo Chen:
A 10-Transistor 65 nm SRAM Cell Tolerant to Single-Event Upsets. J. Electron. Test. 32(2): 137-145 (2016) - [j13]Qingyu Chen, Haibin Wang, Li Chen, Lixiang Li, Xing Zhao, Rui Liu, Mo Chen, Xuantian Li:
An SEU-Resilient SRAM Bitcell in 65-nm CMOS Technology. J. Electron. Test. 32(3): 385-391 (2016) - [j12]Qingyu Chen, Li Chen, Haibin Wang, Longsheng Wu, Yuanqing Li, Xing Zhao, Mo Chen:
Instruction-Vulnerability-Factor-Based Reliability Analysis Model for Program Memory. J. Electron. Test. 32(6): 695-703 (2016) - [j11]Zhichao Zhang, Anh Dinh, Li Chen:
A 0.1-8 GHz wideband low-noise amplifier exploiting gain-enhanced noise-cancelling technique. IEICE Electron. Express 13(2): 20150917 (2016) - [c10]Michael Newton, Brook Danger, Li Chen, Ramaswami Sammynaiken, Haibin Wang, David M. Hiemstra, Valeri Kirischian:
Single photon absorption laser facility for single event effect testing. CCECE 2016: 1-5 - [c9]Haibin Wang, Rui Liu, Xuantian Li, Li Chen, David M. Hiemstra, Valeri Kirischian:
Total ionizing dose test facilities for micro-electronic circuits. CCECE 2016: 1-4 - 2015
- [j10]Haibin Wang, Rui Liu, Li Chen, Jinshun Bi, Mulong Li, Yuanqing Li:
A Novel Built-in Current Sensor for N-WELL SET Detection. J. Electron. Test. 31(4): 395-401 (2015) - [j9]Lixiang Li, Yuanqing Li, Haibin Wang, Rui Liu, Qiong Wu, Michael Newton, Yuan Ma, Li Chen:
Simulation and Experimental Evaluation of a Soft Error Tolerant Layout for SRAM 6T Bitcell in 65nm Technology. J. Electron. Test. 31(5-6): 561-568 (2015) - [c8]Lixiang Li, Yuanqing Li, Yuan Ma, Li Chen:
A novel asymmetrical SRAM cell tolerant to soft errors. CCECE 2015: 1403-1408 - [c7]Rui Liu, Adrian Evans, Qiong Wu, Yuanqing Li, Li Chen, Shi-Jie Wen, Rick Wong, Rita Fung:
Analysis of advanced circuits for SET measurement. IRPS 2015: 7 - 2014
- [j8]Yi Ren, Anlin He, Shuting Shi, Gang Guo, Li Chen, Shi-Jie Wen, Richard Wong, N. W. van Vonno, Bharat L. Bhuva:
Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser. J. Electron. Test. 30(1): 149-154 (2014) - [j7]Yi Ren, Li Chen:
The Effect of Temperature-Induced Quiescent Operating Point Shift on Single-Event Transient Sensitivity in Analog/Mixed-Signal Circuits. J. Electron. Test. 30(3): 377-382 (2014) - [j6]Haibin Wang, Mulong Li, Li Chen, Rui Liu, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Rita Fung, Jinshun Bi:
Single Event Resilient Dynamic Logic Designs. J. Electron. Test. 30(6): 751-761 (2014) - [c6]Hao Xie, Li Chen, Rui Liu, Adrian Evans, Dan Alexandrescu, Shi-Jie Wen, Rick Wong:
New approaches for synthesis of redundant combinatorial logic for selective fault tolerance. IOLTS 2014: 62-68 - 2013
- [j5]Zhichao Zhang, Yi Ren, Li Chen, Nelson J. Gaspard, Arthur F. Witulski, W. Timothy Holman, Bharat L. Bhuva, Shi-Jie Wen, Ramaswami Sammynaiken:
A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event Transients. J. Electron. Test. 29(2): 249-253 (2013) - [j4]Yi Ren, Shuting Shi, Li Chen, Haibin Wang, L.-J. Gao, Gang Guo, Shi-Jie Wen, Richard Wong, N. W. van Vonno:
Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller. J. Electron. Test. 29(4): 609-616 (2013) - [j3]Zhichao Zhang, Anh Dinh, Li Chen, Muhammad Raashid Khan:
A low noise figure 2-GHz bandwidth LNA using resistive feedback with additional input inductors. IEICE Electron. Express 10(21): 20130672 (2013) - [j2]Zhichao Zhang, Muhammad Raashid Khan, Anh Dinh, Li Chen:
A high linear broadband cascode LNA employing common-gate linearity enhancing technology. IEICE Electron. Express 10(23): 20130603 (2013) - [c5]Hao Xie, Li Chen, Adrian Evans, Shi-Jie Wen, Rick Wong:
Synthesis of Redundant Combinatorial Logic for Selective Fault Tolerance. PRDC 2013: 128-129 - 2012
- [j1]Yi Ren, L. Fan, Li Chen, Shi-Jie Wen, Richard Wong, N. W. van Vonno, Arthur F. Witulski, Bharat L. Bhuva:
Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter. J. Electron. Test. 28(6): 877-883 (2012) - [c4]Zhichao Zhang, Muhammad Raashid Khan, Li Chen, Anh Dinh:
A broadband high linear LNA for GSM/LTE wireless communications. CCECE 2012: 1-4 - [c3]Zhichao Zhang, Anh Dinh, Li Chen:
A 2 GHz bandwidth LNA using resistive feedback with added inductor. ICUWB 2012: 375-378 - 2010
- [c2]Xiuxin Yang, Anh Dinh, Li Chen:
A wearable real-time fall detector based on Naive Bayes classifier. CCECE 2010: 1-4 - [c1]Zhichao Zhang, Tao Wang, Li Chen, Jinsheng Yang:
A new Bulk Built-In Current Sensing circuit for single-event transient detection. CCECE 2010: 1-4
Coauthor Index
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