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"Analysis of advanced circuits for SET measurement."

Rui Liu et al. (2015)

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DOI: 10.1109/IRPS.2015.7112827

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-26

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  - conf/irps/LiuEWLCWWF15
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Rui Liu, Adrian Evans, Qiong Wu, Yuanqing Li, Li Chen, Shi-Jie Wen, Rick Wong, Rita Fung:
Analysis of advanced circuits for SET measurement. IRPS 2015: 7

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