"A single event upset tolerant latch design."

Haibin Wang et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.07.019

access: closed

type: Journal Article

metadata version: 2022-10-26

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Haibin Wang, Xixi Dai, Yangsheng Wang, Issam Nofal, Li Cai, Zicai Shen, Wanxiu Sun, Jinshun Bi, Bo Li, Gang Guo, Li Chen, Sang H. Baeg:
A single event upset tolerant latch design. Microelectron. Reliab. 88-90: 909-913 (2018)

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