"Simulation and Experimental Evaluation of a Soft Error Tolerant Layout for ..."

Lixiang Li et al. (2015)

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DOI: 10.1007/S10836-015-5549-X

access: closed

type: Journal Article

metadata version: 2022-10-02

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  - https://dblp.org/rec/journals/et/LiLWLWNMC15
Lixiang Li, Yuanqing Li, Haibin Wang, Rui Liu, Qiong Wu, Michael Newton, Yuan Ma, Li Chen:
Simulation and Experimental Evaluation of a Soft Error Tolerant Layout for SRAM 6T Bitcell in 65nm Technology. J. Electron. Test. 31(5-6): 561-568 (2015)

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