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2020 – today
- 2024
[j15]Ruifeng Guo
, Jingxuan Wei, Linzhuang Sun, Bihui Yu, Guiyong Chang, Dawei Liu, Sibo Zhang, Zhengbing Yao, Mingjun Xu, Liping Bu:
A survey on advancements in image-text multimodal models: From general techniques to biomedical implementations. Comput. Biol. Medicine 178: 108709 (2024)- [j14]Jingxuan Wei, Cheng Tan, Zhangyang Gao, Linzhuang Sun, Siyuan Li, Bihui Yu, Ruifeng Guo, Stan Z. Li:
Enhancing human-like multimodal reasoning: a new challenging dataset and comprehensive framework. Neural Comput. Appl. 36(33): 20849-20861 (2024) - [c51]Jingxuan Wei, Linzhuang Sun, Yichong Leng, Xu Tan, Bihui Yu, Ruifeng Guo:
Sentence-Level or Token-Level? A Comprehensive Study on Knowledge Distillation. IJCAI 2024: 6531-6540 - [c50]Jingxuan Wei, Cheng Tan, Zhangyang Gao, Linzhuang Sun, Bihui Yu, Ruifeng Guo, Stan Z. Li:
Interpretable and Generalizable Spatiotemporal Predictive Learning with Disentangled Consistency. ECML/PKDD (3) 2024: 3-20 - [i6]Jingxuan Wei, Nan Xu, Guiyong Chang, Yin Luo, Bihui Yu, Ruifeng Guo:
mChartQA: A universal benchmark for multimodal Chart Question Answer based on Vision-Language Alignment and Reasoning. CoRR abs/2404.01548 (2024) - [i5]Jingxuan Wei, Linzhuang Sun, Yichong Leng, Xu Tan, Bihui Yu, Ruifeng Guo:
Sentence-Level or Token-Level? A Comprehensive Study on Knowledge Distillation. CoRR abs/2404.14827 (2024) - [i4]Cheng Tan, Jingxuan Wei, Linzhuang Sun, Zhangyang Gao, Siyuan Li, Bihui Yu, Ruifeng Guo, Stan Z. Li:
Retrieval Meets Reasoning: Even High-school Textbook Knowledge Benefits Multimodal Reasoning. CoRR abs/2405.20834 (2024) - 2023
- [j13]Chuting Wang, Ruifeng Guo, Haoyu Yu, Yi Hu, Chao Liu, Changyi Deng:
Task offloading in cloud-edge collaboration-based cyber physical machine tool. Robotics Comput. Integr. Manuf. 79: 102439 (2023) - [i3]Jingxuan Wei, Cheng Tan, Zhangyang Gao, Linzhuang Sun, Siyuan Li, Bihui Yu, Ruifeng Guo, Stan Z. Li:
Enhancing Human-like Multi-Modal Reasoning: A New Challenging Dataset and Comprehensive Framework. CoRR abs/2307.12626 (2023) - [i2]Ruifeng Guo, Jingxuan Wei, Linzhuang Sun, Bihui Yu, Guiyong Chang, Dawei Liu, Sibo Zhang, Zhengbing Yao, Mingjun Xu, Liping Bu:
A Survey on Image-text Multimodal Models. CoRR abs/2309.15857 (2023) - 2021
- [j12]Haotian Wu, Ruifeng Guo, Yi Hu:
FERNANDO: A Software Transient Fault Tolerance Approach for Embedded Systems Based on Redundant Multi-Threading. IEEE Access 9: 67154-67166 (2021) - [c49]Yu Huang, Wu-Tung Cheng, Ruifeng Guo, Sameer Chillarige:
Diagnosis and Yield Learning. ITC-Asia 2021: 1 - [i1]Ruifeng Guo:
Designing an Android Application for Bills Segregation. CoRR abs/2104.06823 (2021)
2010 – 2019
- 2018
- [j11]Changyi Deng, Ruifeng Guo, Chao Liu, Ray Y. Zhong, Xun Xu:
Data cleansing for energy-saving: a case of Cyber-Physical Machine Tools health monitoring system. Int. J. Prod. Res. 56(1-2): 1000-1015 (2018) - [c48]Shuai Wang, Ruifeng Guo, Hongliang Wang, Yuanjing Ma, Zixiao Zong:
Manufacture Assembly Fault Detection Method based on Deep Learning and Mixed Reality. ICIA 2018: 808-813 - [c47]Mo Su, Yingjie Deng, Ruifeng Guo, Yuanjing Ma, Zixiao Zong, Qile Wang, Ning Jiang:
Research on the Management Model Based on 3D Visualization Service Platform. ICIA 2018: 1404-1410 - [c46]Yuanjing Ma, Ruifeng Guo, Min Liu, Shuai Wang, Xiaolei Zhou:
Real-Time Circuit Breaker State Detection and Identification Method Based on Faster R-CNN. ICIA 2018: 1540-1544 - [c45]Haotian Wu, Ruifeng Guo, Azhen Peng, Wenjiang Wu:
A real-time system low power scheduling algorithm based on total bandwidth server. ICIA 2018: 1566-1570 - [c44]Liming Duan, Rongli Gai, Ruifeng Guo, Ray Y. Zhong, Fenghai Wang:
Linking events-based communication mechanism in multi-agent systems. ICNSC 2018: 1-5 - [c43]Ruifeng Guo, Brian Archer, Kevin Chau, Xiaolei Cai:
Efficient Cell-Aware Defect Characterization for Multi-bit Cells. ITC-Asia 2018: 7-12 - 2017
- [c42]Liming Duan, Fenghai Wang, Ruifeng Guo, Rongli Gai:
A fault diagnosis method for information systems based on weighted fault diagnosis tree. Healthcom 2017: 1-6 - [c41]Mo Su, Ruifeng Guo, Hongliang Wang, Shuai Wang:
Research on scene management technology based on adaptive binary tree and scene graph. ICIA 2017: 35-40 - [c40]Mo Su, Ruifeng Guo, Hongliang Wang, Shuai Wang, Peng Niu:
View frustum culling algorithm based on optimized scene management structure. ICIA 2017: 838-842 - 2016
- [c39]Changyi Deng, Ruifeng Guo, Hongliang Wang, Azhen Peng:
A Dynamic Power Management Algorithm for Sporadic Tasks in Real-Time Embedded Systems. Trustcom/BigDataSE/ISPA 2016: 2073-2078 - 2015
- [j10]Jing Ye, Yu Huang, Yu Hu, Wu-Tung Cheng, Ruifeng Guo, Liyang Lai, Ting-Pu Tai, Xiaowei Li, Wei-pin Changchien, Daw-Ming Lee, Ji-Jan Chen, Sandeep C. Eruvathi, Kartik K. Kumara, Charles C. C. Liu, Sam Pan:
Diagnosis and Layout Aware (DLA) Scan Chain Stitching. IEEE Trans. Very Large Scale Integr. Syst. 23(3): 466-479 (2015) - 2013
- [j9]Hongliang Wang, Ruifeng Guo:
Improving the simulation efficiency in five-axis milling by using an advanced octree and an implicit formula of a generalized cutter. J. Syst. Sci. Complex. 26(5): 735-756 (2013) - [c38]Hongliang Wang, Ruifeng Guo, Han Zhang, Yiwen Zhang, Ruirui Chen:
A tool path error estimate in computer numerical control for five-axis machining. ICNC 2013: 1639-1643 - [c37]Jing Ye, Yu Huang, Yu Hu, Wu-Tung Cheng, Ruifeng Guo, Liyang Lai, Ting-Pu Tai, Xiaowei Li, Wei-pin Changchien, Daw-Ming Lee, Ji-Jan Chen, Sandeep C. Eruvathi, Kartik K. Kumara, Charles C. C. Liu, Sam Pan:
Diagnosis and Layout Aware (DLA) scan chain stitching. ITC 2013: 1-10 - [c36]Jiun-Lang Huang, Kun-Han Tsai, Yu-Ping Liu, Ruifeng Guo, Manish Sharma, Wu-Tung Cheng:
Improve speed path identification with suspect path expressions. VLSI-DAT 2013: 1-4 - 2012
- [j8]Jing Zeng, Ruifeng Guo, Wu-Tung Cheng, Michael Mateja, Jing Wang:
Scan-Based Speed-Path Debug for a Microprocessor. IEEE Des. Test Comput. 29(4): 92-99 (2012) - [c35]Hongliang Wang, Ruifeng Guo, Xian Liu, Xiaohu Lu, Yillin Zheng:
Material Removal Simulation of Multi-axis NC Milling Based on Spatial Partitioning Level of Detail Model. CIT 2012: 536-540 - 2011
- [j7]Zhixiang Shao, Ruifeng Guo, Jie Li, Jianjun Peng:
Accurate Modeling Method for Generalized Tool Swept Volume in 5-axis NC Machining Simulation. J. Softw. 6(10): 2056-2063 (2011) - [c34]Xun Tang, Wu-Tung Cheng, Ruifeng Guo, Huaxing Tang, Sudhakar M. Reddy:
Diagnosis of Multiple Faults Based on Fault-Tuple Equivalence Tree. DFT 2011: 217-225 - [c33]Jianjun Peng, Ruifeng Guo, Jiping Li, Zhixiang Shao, Jie Li:
Research on tool swept volume in NC simulation. EMEIT 2011: 2687-2690 - 2010
- [j6]Xiuwu Zhang, Ruifeng Guo, Weimin Lei, Wei Zhang:
A Topology-Aware Relay Lookup Scheme for P2P VoIP System. Int. J. Commun. Netw. Syst. Sci. 3(2): 119-125 (2010) - [c32]Ke Peng, Yu Huang, Ruifeng Guo, Wu-Tung Cheng, Mohammad Tehranipoor:
Emulating and diagnosing IR-drop by using dynamic SDF. ASP-DAC 2010: 511-516 - [c31]Xun Tang, Wu-Tung Cheng, Ruifeng Guo, Sudhakar M. Reddy:
Diagnosis of Multiple Physical Defects Using Logic Fault Models. Asian Test Symposium 2010: 94-99 - [c30]Jing Zeng, Ruifeng Guo, Wu-Tung Cheng, Michael Mateja, Jing Wang, Kun-Han Tsai, Ken Amstutz:
Scan based speed-path debug for a microprocessor. ETS 2010: 207-212
2000 – 2009
- 2009
- [c29]Yu Huang, Wu-Tung Cheng, Ruifeng Guo, Ting-Pu Tai, Feng-Ming Kuo, Yuan-Shih Chen:
Scan Chain Diagnosis by Adaptive Signal Profiling with Manufacturing ATPG Patterns. Asian Test Symposium 2009: 35-40 - [c28]Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. Reddy, Yu Huang:
On Improving Diagnostic Test Generation for Scan Chain Failures. Asian Test Symposium 2009: 41-46 - [c27]Kun-Han Tsai, Ruifeng Guo, Wu-Tung Cheng:
At-Speed Scan Test Method for the Timing Optimization and Calibration. Asian Test Symposium 2009: 430-433 - [c26]Wanfu Ding, Ruifeng Guo:
An Effective RM-Based Scheduling Algorithm for Fault-Tolerant Real-Time Systems. CSE (2) 2009: 759-764 - [c25]Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. Reddy:
Improving compressed test pattern generation for multiple scan chain failure diagnosis. DATE 2009: 1000-1005 - [c24]Ruifeng Guo, Wu-Tung Cheng, Kun-Han Tsai:
Speed-Path Debug Using At-Speed Scan Test Patterns. ETS 2009: 11-16 - [c23]Wanfu Ding, Ruifeng Guo:
Enhancing the Success Rate of Primary Version While Guaranteeing Fault-Tolerant Capability for Real-Time Systems. PRDC 2009: 351-356 - 2008
- [j5]Yu Huang, Ruifeng Guo, Wu-Tung Cheng, James Chien-Mo Li:
Survey of Scan Chain Diagnosis. IEEE Des. Test Comput. 25(3): 240-248 (2008) - [c22]Wu-Tung Cheng, Brady Benware, Ruifeng Guo, Kun-Han Tsai, Takeo Kobayashi, Kazuyuki Maruo, Michinobu Nakao, Yoshiaki Fukui, Hideyuki Otake:
Enhancing Transition Fault Model for Delay Defect Diagnosis. ATS 2008: 179-184 - [c21]Kun-Han Tsai, Ruifeng Guo, Wu-Tung Cheng:
A Robust Automated Scan Pattern Mismatch Debugger. ATS 2008: 309-314 - [c20]Yu Huang, Wu-Tung Cheng, Ruifeng Guo:
Diagnose Multiple Stuck-at Scan Chain Faults. ETS 2008: 105-110 - [c19]Wanfu Ding, Ruifeng Guo:
Design and Evaluation of Sectional Real-Time Scheduling Algorithms Based on System Load. ICYCS 2008: 14-18 - [c18]Ruifeng Guo, Liyang Lai, Yu Huang, Wu-Tung Cheng:
Detection and Diagnosis of Static Scan Cell Internal Defect. ITC 2008: 1-10 - 2007
- [c17]Ruifeng Guo, Yu Huang, Wu-Tung Cheng:
Fault Dictionary Based Scan Chain Failure Diagnosis. ATS 2007: 45-52 - [c16]Ruifeng Guo, Yu Huang, Wu-Tung Cheng:
A complete test set to diagnose scan chain failures. ITC 2007: 1-10 - [c15]Yu Huang, Wu-Tung Cheng, Ruifeng Guo, Will Hsu, Yuan-Shih Chen, Albert Mann:
Diagnose compound scan chain and system logic defects. ITC 2007: 1-10 - [c14]Vishnu C. Vimjam, M. Enamul Amyeen, Ruifeng Guo, Srikanth Venkataraman, Michael S. Hsiao, Kai Yang:
Using Scan-Dump Values to Improve Functional-Diagnosis Methodology. VTS 2007: 231-238 - 2006
- [j4]Ruifeng Guo, Srikanth Venkataraman:
An algorithmic technique for diagnosis of faulty scan chains. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(9): 1861-1868 (2006) - [c13]Ruifeng Guo, Subhasish Mitra, M. Enamul Amyeen, Jinkyu Lee, Srihari Sivaraj, Srikanth Venkataraman:
Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive. VTS 2006: 66-71 - 2005
- [c12]Zoran Stanojevic, Ruifeng Guo, Subhasish Mitra, Srikanth Venkataraman:
Enabling yield analysis with X-compact. ITC 2005: 9 - [c11]Dong Yu, Hu Lin, Ruifeng Guo, Jiangang Yang, Pengfei Xiao:
The Research on Real-Time Middleware for Open Architecture Controller. RTCSA 2005: 80-83 - 2004
- [c10]Srikanth Venkataraman, Srihari Sivaraj, M. Enamul Amyeen, Sangbong Lee, Ajay Ojha, Ruifeng Guo:
An Experimental Study of N-Detect Scan ATPG Patterns on a Processor. VTS 2004: 23-30 - 2003
- [j3]Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz:
Reverse-order-restoration-based static test compaction for synchronous sequential circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22(3): 293-304 (2003) - [j2]Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz:
PROPTEST: a property-based test generator for synchronous sequential circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22(8): 1080-1091 (2003) - [c9]Xiaoming Yu, M. Enamul Amyeen, Srikanth Venkataraman, Ruifeng Guo, Irith Pomeranz:
Concurrent Execution of Diagnostic Fault Simulation and Equivalence Identification During Diagnostic Test Generation. VTS 2003: 351-358 - 2001
- [c8]Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz:
On Improving a Fault Simulation Based Test Generator for Synchronous Sequential Circuits. Asian Test Symposium 2001: 82- - [c7]Ruifeng Guo, Srikanth Venkataraman:
A technique for fault diagnosis of defects in scan chains. ITC 2001: 268-277 - [c6]Ruifeng Guo, Irith Pomeranz, Sudhakar M. Reddy:
On Improving Static Test Compaction for Sequential Circuits. VLSI Design 2001: 111-116
1990 – 1999
- 1999
- [j1]Irith Pomeranz, Sudhakar M. Reddy, Ruifeng Guo:
Static test compaction for synchronous sequential circuits based on vector restoration. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18(7): 1040-1049 (1999) - [c5]Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz:
Proptest: A Property Based Test Pattern Generator for Sequential Circuits Using Test Compaction. DAC 1999: 653-659 - [c4]Yun Shao, Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz:
The effects of test compaction on fault diagnosis. ITC 1999: 1083-1089 - [c3]Ruifeng Guo, Irith Pomeranz, Sudhakar M. Reddy:
A Fault Simulation Based Test Pattern Generator for Synchronous Sequential Circuits. VTS 1999: 260-267 - 1998
- [c2]Ruifeng Guo, Irith Pomeranz, Sudhakar M. Reddy:
On Speeding-Up Vector Restoration Based Static Compaction of Test Sequences for Sequential Circuits . Asian Test Symposium 1998: 467-471 - [c1]Ruifeng Guo, Irith Pomeranz, Sudhakar M. Reddy:
Procedures for Static Compaction of Test Sequences for Synchronous Sequential Circuits Based on Vector Restoration. DATE 1998: 583-587
Coauthor Index
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