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"PROPTEST: a property-based test generator for synchronous sequential circuits."

Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz (2003)

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DOI: 10.1109/TCAD.2003.814953

access: closed

type: Journal Article

metadata version: 2020-09-24

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Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz:
PROPTEST: a property-based test generator for synchronous sequential circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22(8): 1080-1091 (2003)

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