"An Experimental Study of N-Detect Scan ATPG Patterns on a Processor."

Srikanth Venkataraman et al. (2004)

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DOI: 10.1109/VTEST.2004.1299221

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-04

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Srikanth Venkataraman, Srihari Sivaraj, M. Enamul Amyeen, Sangbong Lee, Ajay Ojha, Ruifeng Guo:
An Experimental Study of N-Detect Scan ATPG Patterns on a Processor. VTS 2004: 23-30

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