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"Efficient Cell-Aware Defect Characterization for Multi-bit Cells."

Ruifeng Guo et al. (2018)

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DOI: 10.1109/ITC-ASIA.2018.00012

access: closed

type: Conference or Workshop Paper

metadata version: 2019-11-12

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  dblp key:
  - conf/itc-asia/GuoACC18
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  - https://dblp.org/rec/conf/itc-asia/GuoACC18
Ruifeng Guo, Brian Archer, Kevin Chau, Xiaolei Cai:
Efficient Cell-Aware Defect Characterization for Multi-bit Cells. ITC-Asia 2018: 7-12

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