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Publication search results
found 93 matches
- 2011
- Haider A. F. Almurib, T. Nandha Kumar, Fabrizio Lombardi:
A Single-Configuration Method for Application-Dependent Testing of SRAM-based FPGA Interconnects. Asian Test Symposium 2011: 444-450 - Baris Arslan, Alex Orailoglu:
Adaptive Test Framework for Achieving Target Test Quality at Minimal Cost. Asian Test Symposium 2011: 323-328 - Manuel J. Barragan Asian, Rafaella Fiorelli, Gildas Léger, Adoración Rueda, José L. Huertas:
Improving the Accuracy of RF Alternate Test Using Multi-VDD Conditions: Application to Envelope-Based Test of LNAs. Asian Test Symposium 2011: 359-364 - Fang Bao, Ke Peng, Krishnendu Chakrabarty, Mohammad Tehranipoor:
On Generation of 1-Detect TDF Pattern Set with Significantly Increased SDD Coverage. Asian Test Symposium 2011: 120-125 - Paolo Bernardi, Matteo Sonza Reorda:
A New Architecture to Cross-Fertilize On-Line and Manufacturing Testing. Asian Test Symposium 2011: 142-147 - Debesh Bhatta, Joshua W. Wells, Abhijit Chatterjee:
Time Domain Characterization and Test of High Speed Signals Using Incoherent Sub-sampling. Asian Test Symposium 2011: 21-26 - Gunjan Bhattacharya, Ilora Maity, Biplab K. Sikdar, Baisakhi Das:
Exploring Impact of Faults on Branch Predictors' Power for Diagnosis of Faulty Module. Asian Test Symposium 2011: 226-231 - Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Kohei Miyase, Xiaoqing Wen:
Power-Aware Test Pattern Generation for At-Speed LOS Testing. Asian Test Symposium 2011: 506-510 - Stefano Di Carlo, Giulio Gambardella, Marco Indaco, Daniele Rolfo, Paolo Prinetto:
MarciaTesta: An Automatic Generator of Test Programs for Microprocessors' Data Caches. Asian Test Symposium 2011: 401-406 - Jae Chul Cha, Sandeep K. Gupta:
Yield-per-Area Optimization for 6T-SRAMs Using an Integrated Approach to Exploit Spares and ECC to Efficiently Combat High Defect and Soft-Error Rates. Asian Test Symposium 2011: 126-135 - Jaewon Cha, Ilwoong Kim, Sungho Kang:
New Fault Detection Algorithm for Multi-level Cell Flash Memroies. Asian Test Symposium 2011: 341-346 - Sreejit Chakravarty:
A Process Monitor Based Speed Binning and Die Matching Algorithm. Asian Test Symposium 2011: 311-316 - Anshuman Chandra, Jyotirmoy Saikia, Rohit Kapur:
Breaking the Test Application Time Barriers in Compression: Adaptive Scan-Cyclical (AS-C). Asian Test Symposium 2011: 432-437 - Po-Juei Chen, Wei-Li Hsu, James Chien-Mo Li, Nan-Hsin Tseng, Kuo-Yin Chen, Wei-pin Changchien, Charles C. C. Liu:
An Accurate Timing-Aware Diagnosis Algorithm for Multiple Small Delay Defects. Asian Test Symposium 2011: 291-296 - Zhen Chen, Jia Li, Dong Xiang, Yu Huang:
Virtual Circuit Model for Low Power Scan Testing in Linear Decompressor-Based Compression Environment. Asian Test Symposium 2011: 96-101 - Zhen Chen, Sharad C. Seth, Dong Xiang, Bhargab B. Bhattacharya:
Diagnosis of Multiple Scan-Chain Faults in the Presence of System Logic Defects. Asian Test Symposium 2011: 297-302 - Yuanqing Cheng, Lei Zhang, Yinhe Han, Jun Liu, Xiaowei Li:
Wrapper Chain Design for Testing TSVs Minimization in Circuit-Partitioned 3D SoC. Asian Test Symposium 2011: 181-186 - Chun-Chuan Chi, Erik Jan Marinissen, Sandeep Kumar Goel, Cheng-Wen Wu:
Multi-visit TAMs to Reduce the Post-Bond Test Length of 2.5D-SICs with a Passive Silicon Interposer Base. Asian Test Symposium 2011: 451-456 - Alejandro Cook, Sybille Hellebrand, Thomas Indlekofer, Hans-Joachim Wunderlich:
Diagnostic Test of Robust Circuits. Asian Test Symposium 2011: 285-290 - K. Darbinyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
A Robust Solution for Embedded Memory Test and Repair. Asian Test Symposium 2011: 461-462 - Prasanjeet Das, Sandeep K. Gupta:
On Generating Vectors for Accurate Post-Silicon Delay Characterization. Asian Test Symposium 2011: 251-260 - Sergej Deutsch, Vivek Chickermane, Brion L. Keller, Subhasish Mukherjee, Mario Konijnenburg, Erik Jan Marinissen, Sandeep Kumar Goel:
Automation of 3D-DfT Insertion. Asian Test Symposium 2011: 395-400 - V. R. Devanathan, Sunil Bhavsar, Rajat Mehrotra:
Physical-Aware Memory BIST Datapath Synthesis: Architecture and Case-Studies on Complex SoCs. Asian Test Symposium 2011: 457-458 - Xiaoxin Fan, Huaxing Tang, Sudhakar M. Reddy, Wu-Tung Cheng, Brady Benware:
On Using Design Partitioning to Reduce Diagnosis Memory Footprint. Asian Test Symposium 2011: 219-225 - Yuntan Fang, Huawei Li, Xiaowei Li:
A Fault Criticality Evaluation Framework of Digital Systems for Error Tolerant Video Applications. Asian Test Symposium 2011: 329-334 - Michal Filipek, Yoshiaki Fukui, Hiroyuki Iwata, Grzegorz Mrugalski, Janusz Rajski, Masahiro Takakura, Jerzy Tyszer:
Low Power Decompressor and PRPG with Constant Value Broadcast. Asian Test Symposium 2011: 84-89 - Paul D. Franzon, W. Rhett Davis, Thorlindur Thorolfsson, Samson Melamed:
3D Specific Systems: Design and CAD. Asian Test Symposium 2011: 470-473 - Masahiro Fujita:
High Level Verification and Its Use at Pos-Silicon Debugging and Patching. Asian Test Symposium 2011: 464-469 - Ashish Goel, Swaroop Ghosh, Mesut Meterelliyoz, Jeff Parkhurst, Kaushik Roy:
Integrated Design & Test: Conquering the Conflicting Requirements of Low-Power, Variation-Tolerance and Test Cost. Asian Test Symposium 2011: 486-491 - Carl Gray, David C. Keezer, Howard Wang, Keren Bergman:
Burst-Mode Transmission and Data Recovery for Multi-GHz Optical Packet Switching Network Testing. Asian Test Symposium 2011: 545-551
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