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"A Robust Solution for Embedded Memory Test and Repair."

K. Darbinyan et al. (2011)

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DOI: 10.1109/ATS.2011.98

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/ats/DarbinyanHSVZ11
K. Darbinyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
A Robust Solution for Embedded Memory Test and Repair. Asian Test Symposium 2011: 461-462

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