default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDYashwant K. Malaiya
Person information
- affiliation: Colorado State University, USA
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
showing all ?? records
2020 – today
- 2023
[c69]Robin J. Yeman
, Yashwant K. Malaiya:
Comparison of Agile Scaling Frameworks. ICISS 2023: 51-57- 2021
- [j26]Jim A. Scheibmeir, Yashwant K. Malaiya:
Social media analytics of the Internet of Things. Discov. Internet Things 1(1) (2021) - 2020
- [j25]Peng Xiao, Yongfeng Yin, Bin Liu, Bo Jiang, Yashwant K. Malaiya:
Adaptive Testing Based on Moment Estimation. IEEE Trans. Syst. Man Cybern. Syst. 50(3): 911-922 (2020)
2010 – 2019
- 2019
- [c68]Jim A. Scheibmeir, Yashwant K. Malaiya:
An API Development Model for Digital Twins. QRS Companion 2019: 518-519 - [c67]Jim A. Scheibmeir, Yashwant K. Malaiya:
Quality Model for Testing Augmented Reality Applications. UEMCON 2019: 219-226 - 2017
- [j24]HyunChul Joh, Yashwant K. Malaiya:
Periodicity in software vulnerability discovery, patching and exploitation. Int. J. Inf. Sec. 16(6): 673-690 (2017) - 2016
- [j23]Awad A. Younis, Yashwant K. Malaiya, Indrajit Ray:
Assessing vulnerability exploitability risk using software properties. Softw. Qual. J. 24(1): 159-202 (2016) - [c66]Awad A. Younis, Yashwant K. Malaiya, Charles Anderson, Indrajit Ray:
To Fear or Not to Fear That is the Question: Code Characteristics of a Vulnerable Functionwith an Existing Exploit. CODASPY 2016: 97-104 - [c65]Awad A. Younis, Yashwant K. Malaiya, Indrajit Ray:
Evaluating CVSS Base Score Using Vulnerability Rewards Programs. SEC 2016: 62-75 - 2015
- [c64]Awad A. Younis, Yashwant K. Malaiya:
Comparing and Evaluating CVSS Base Metrics and Microsoft Rating System. QRS 2015: 252-261 - 2014
- [j22]HyunChul Joh, Yashwant K. Malaiya:
Modeling Skewness in Vulnerability Discovery. Qual. Reliab. Eng. Int. 30(8): 1445-1459 (2014) - [c63]Awad A. Younis, Yashwant K. Malaiya, Indrajit Ray:
Using Attack Surface Entry Points and Reachability Analysis to Assess the Risk of Software Vulnerability Exploitability. HASE 2014: 1-8 - [c62]Omar Hussain Alhazmi, Yashwant K. Malaiya:
Are the Classical Disaster Recovery Tiers Still Applicable Today? ISSRE Workshops 2014: 144-145 - [c61]Awad A. Younis, Yashwant K. Malaiya:
Using Software Structure to Predict Vulnerability Exploitation Potential. SERE (Companion) 2014: 13-18 - 2012
- [c60]Omar Hussain Alhazmi, Yashwant K. Malaiya:
Assessing Disaster Recovery Alternatives: On-Site, Colocation or Cloud. ISSRE Workshops 2012: 19-20 - 2011
- [j21]Sung-Whan Woo, HyunChul Joh, Omar Hussain Alhazmi, Yashwant K. Malaiya:
Modeling vulnerability discovery process in Apache and IIS HTTP servers. Comput. Secur. 30(1): 50-62 (2011) - 2010
- [c59]Xin He, Yashwant K. Malaiya, Anura P. Jayasumana, Kenneth P. Parker, Stephen Hird:
Principal Component Analysis-based compensation for measurement errors due to mechanical misalignments in PCB testing. ITC 2010: 467-476
2000 – 2009
- 2009
- [c58]HyunChul Joh, Yashwant K. Malaiya:
Seasonal Variation in the Vulnerability Discovery Process. ICST 2009: 191-200 - [c57]Xin He, Yashwant K. Malaiya, Anura P. Jayasumana, Kenneth P. Parker, Stephen Hird:
An outlier detection based approach for PCB testing. ITC 2009: 1-10 - 2008
- [j20]Omar Hussain Alhazmi, Yashwant K. Malaiya:
Application of Vulnerability Discovery Models to Major Operating Systems. IEEE Trans. Reliab. 57(1): 14-22 (2008) - [j19]Shen Hui Wu, Sridhar Jandhyala, Yashwant K. Malaiya, Anura P. Jayasumana:
Antirandom Testing: A Distance-Based Approach. VLSI Design 2008: 165709:1-165709:9 (2008) - [c56]HyunChul Joh, Yashwant K. Malaiya:
Seasonality in Vulnerability Discovery in Major Software Systems. ISSRE 2008: 297-298 - [c55]HyunChul Joh, Jinyoo Kim, Yashwant K. Malaiya:
Vulnerability Discovery Modeling Using Weibull Distribution. ISSRE 2008: 299-300 - 2007
- [j18]Omar Hussain Alhazmi, Yashwant K. Malaiya, Indrajit Ray:
Measuring, analyzing and predicting security vulnerabilities in software systems. Comput. Secur. 26(3): 219-228 (2007) - [c54]Jinyoo Kim, Yashwant K. Malaiya, Indrakshi Ray:
Vulnerability Discovery in Multi-Version Software Systems. HASE 2007: 141-148 - 2006
- [c53]Omar Hussain Alhazmi, Sung-Whan Woo, Yashwant K. Malaiya:
Security vulnerability categories in major software systems. Communication, Network, and Information Security 2006: 138-143 - [c52]Sung-Whan Woo, Omar Hussain Alhazmi, Yashwant K. Malaiya:
Assessing Vulnerabilities in Apache and IIS HTTP Servers. DASC 2006: 103-110 - [c51]Omar Hussain Alhazmi, Yashwant K. Malaiya:
Measuring and Enhancing Prediction Capabilities of Vulnerability Discovery Models for Apache and IIS HTTP Servers. ISSRE 2006: 343-352 - [c50]Ashutosh Sharma, Anura P. Jayasumana, Yashwant K. Malaiya:
X-IDDQ: A Novel Defect Detection Technique Using IDDQ Data. VTS 2006: 180-185 - 2005
- [c49]Artem Sokolov, Alodeep Sanyal, L. Darrell Whitley, Yashwant K. Malaiya:
Dynamic power minimization during combinational circuit testing as a traveling salesman problem. Congress on Evolutionary Computation 2005: 1088-1095 - [c48]Omar Hussain Alhazmi, Yashwant K. Malaiya, Indrajit Ray:
Security Vulnerabilities in Software Systems: A Quantitative Perspective. DBSec 2005: 281-294 - [c47]Omar Hussain Alhazmi, Yashwant K. Malaiya:
Modeling the Vulnerability Discovery Process. ISSRE 2005: 129-138 - 2004
- [c46]Jiao Chen, Yashwant K. Malaiya:
Augmenting Test Case Generation Using Statechart. Software Engineering Research and Practice 2004: 608-614 - 2002
- [j17]Yashwant K. Malaiya, Michael Naixin Li, James M. Bieman, Rick Karcich:
Software reliability growth with test coverage. IEEE Trans. Reliab. 51(4): 420-426 (2002) - 2000
- [c45]Yashwant K. Malaiya, Jason Denton:
Module Size Distribution and Defect Density. ISSRE 2000: 62-71
1990 – 1999
- 1999
- [c44]Yashwant K. Malaiya, Jason Denton:
Requirements volatility and defect density. ISSRE 1999: 285-294 - 1998
- [c43]Yashwant K. Malaiya, Jason Denton:
Estimating the Number of Residual Defects. HASE 1998: 98-107 - [c42]Shen Hui Wu, Yashwant K. Malaiya, Anura P. Jayasumana:
Antirandom vs. pseudorandom testing. ICCD 1998: 221-223 - 1997
- [j16]Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong:
Operational and Test Performance in the Presence of Built-in Current Sensors. VLSI Design 5(3): 285-298 (1997) - [c41]Huifang Yin, Zemen Lebne-Dengel, Yashwant K. Malaiya:
Automatic test generation using checkpoint encoding and antirandom testing. ISSRE 1997: 84-95 - [c40]Yashwant K. Malaiya, Jason Denton:
What do the software reliability growth model parameters represent? ISSRE 1997: 124-135 - [c39]Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana:
Input Pattern Classification for Detection of Stuck-ON and Bridging Faults Using IDDQ Testing in BiCMOS and CMOS Circuits. VLSI Design 1997: 545-546 - 1996
- [j15]Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana:
Fault Modeling of ECL for High Fault Coverage of Physical Defects. VLSI Design 4(3): 231-242 (1996) - [c38]Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya:
Input Pattern Classification for Transistor Level Testing of Bridging Faults in BiCMOS Circuits. Great Lakes Symposium on VLSI 1996: 214-219 - [c37]Michael Naixin Li, Yashwant K. Malaiya:
Fault exposure ratio estimation and applications. ISSRE 1996: 372-381 - 1995
- [j14]Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Rochit Rajsuman:
Testable design of BiCMOS circuits for stuck-open fault detection using single patterns. IEEE J. Solid State Circuits 30(8): 855-863 (1995) - [c36]Anura P. Jayasumana, Yashwant K. Malaiya, Sankaran M. Menon:
A Novel High-Speed BiCMOS Domino Logic Family. ISCAS 1995: 21-24 - [c35]Yashwant K. Malaiya:
Antirandom testing: getting the most out of black-box testing. ISSRE 1995: 86-95 - [c34]Michael Naixin Li, Yashwant K. Malaiya:
ROBUST: a next generation software reliability engineering tool. ISSRE 1995: 375-380 - [c33]Ramanagopal V. Vogety, Yashwant K. Malaiya, Anura P. Jayasumana:
Interconnection of FDDI-II networks through an ATM backbone - An analysis. LCN 1995: 150-157 - 1994
- [j13]Yashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong, Sankaran M. Menon:
Resolution Enhancement in IDDQ Testing for Large ICs. VLSI Design 1(4): 277-284 (1994) - [c32]Yashwant K. Malaiya, Michael Naixin Li, James M. Bieman, Rick Karcich, Bob Skibbe:
The relationship between test coverage and reliability. ISSRE 1994: 186-195 - [c31]Michael Naixin Li, Yashwant K. Malaiya:
On input profile selection for software testing. ISSRE 1994: 196-205 - [c30]Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong:
The Effect of Built-In Current Sensors (BICS) on Operational and Test Performance. VLSI Design 1994: 187-190 - [c29]Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya:
Input pattern classification for transistor level testing of BiCMOS circuits. VTS 1994: 457-462 - 1993
- [j12]Yashwant K. Malaiya, Anneliese von Mayrhauser, Pradip K. Srimani:
An Examination of Fault Exposure Ratio. IEEE Trans. Software Eng. 19(11): 1087-1094 (1993) - [j11]W. K. Al-Assadi, Yashwant K. Malaiya, Anura P. Jayasumana:
Faulty behavior of storage elements and its effects on sequential circuits. IEEE Trans. Very Large Scale Integr. Syst. 1(4): 446-452 (1993) - [c28]Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya:
Test Generation for BiCMOS Circuits. ISCAS 1993: 1987-1990 - [c27]Michael Naixin Li, Yashwant K. Malaiya:
Enhancing accuracy of software reliability prediction. ISSRE 1993: 71-79 - [c26]Kang Wu, Yashwant K. Malaiya:
The effect of correlated faults on software reliability. ISSRE 1993: 80-89 - [c25]Anneliese von Mayrhauser, Yashwant K. Malaiya, Pradip K. Srimani, James Keables:
On the need for simulation for better characterization of software reliability. ISSRE 1993: 264-273 - [c24]W. K. Al-Assadi, Yashwant K. Malaiya, Anura P. Jayasumana:
Use of Storage Elements as Primitives for Modelling Faults in Synchronous Sequential Circuits. VLSI Design 1993: 118-123 - [c23]Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya:
Testable design for BiCMOS stuck-open fault detection. VTS 1993: 296-302 - 1992
- [j10]Yashwant K. Malaiya:
Guest Editor's Introduction: VLSI Design 92. IEEE Des. Test Comput. 9(4): 4-5 (1992) - [j9]Pradip K. Srimani, Yashwant K. Malaiya:
Steps to Practical Reliability Meassurement - Guest Editors' Introduction. IEEE Softw. 9(4): 10-12 (1992) - [j8]Nachimuthu Karunanithi, L. Darrell Whitley, Yashwant K. Malaiya:
Using Neural Networks in Reliability Prediction. IEEE Softw. 9(4): 53-59 (1992) - [j7]Nachimuthu Karunanithi, L. Darrell Whitley, Yashwant K. Malaiya:
Prediction of Software Reliability Using Connectionist Models. IEEE Trans. Software Eng. 18(7): 563-574 (1992) - [c22]Yashwant K. Malaiya, Anneliese von Mayrhauser, Pradip K. Srimani:
The nature of fault exposure ratio. ISSRE 1992: 23-32 - [c21]Nachimuthu Karunanithi, Yashwant K. Malaiya:
The scaling problem in neural networks for software reliability prediction. ISSRE 1992: 76-82 - [c20]Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya:
On Bridging Faults in ECL Circuits. VLSI Design 1992: 55-60 - [c19]Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana:
Behavior of faulty single BJT BiCMOS logic gates. VTS 1992: 315-320 - 1991
- [j6]Yinghua Min, Yashwant K. Malaiya, Boping Jin:
Analysis of Detection Capability of Parallel Signature Analyzers. IEEE Trans. Computers 40(9): 1075-1081 (1991) - [c18]Yashwant K. Malaiya, Pradip K. Srimani:
An Introduction to Software Reliability Models. Int. CMG Conference 1991: 1237-1239 - [c17]Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya:
Gate level representation of ECL circuits for fault modeling. Great Lakes Symposium on VLSI 1991: 330-331 - [c16]Nachimuthu Karunanithi, Yashwant K. Malaiya, L. Darrell Whitley:
Prediction of software reliability using neural networks. ISSRE 1991: 124-130 - [c15]Rochit Rajsuman, Anura P. Jayasumana, Yashwant K. Malaiya, Juney Park:
An analysis and testing of operation induced faults in MOS VLSI. VTS 1991: 137-142 - [c14]Sheng Feng, Yashwant K. Malaiya:
Evaluation of detectability in BIST environment. VTS 1991: 271-276 - [c13]Yashwant K. Malaiya, Anura P. Jayasumana, Qiao Tong, Sankaran M. Menon:
Enhancement of resolution in supply current based testing for large ICs. VTS 1991: 291-296 - [e1]Yashwant K. Malaiya:
Proceedings of the 24th Annual IEEE/ACM International Symposium on Microarchitecture, MICRO 24, Albuquerque, New Mexico, USA, November 18-20, 1991. ACM/IEEE 1991, ISBN 0-89791-460-0 [contents] - 1990
- [c12]Yashwant K. Malaiya, Nachimuthu Karunanithi, Pradeep Verma:
Predictability measures for software reliability models. COMPSAC 1990: 7-12 - [c11]Suntae Hwang, Rochit Rajsuman, Yashwant K. Malaiya:
On the testing of microprogrammed processor. MICRO 1990: 260-266
1980 – 1989
- 1989
- [j5]Rochit Rajsuman, Yashwant K. Malaiya, Anura P. Jayasumana:
Limitations of switch level analysis for bridging faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 8(7): 807-811 (1989) - [c10]Rochit Rajsuman, Anura P. Jayasumana, Yashwant K. Malaiya:
CMOS Stuck-open Fault Detection Using Single Test Patterns. DAC 1989: 714-717 - [c9]Yashwant K. Malaiya:
On inherent untestability of unaugmented microprogrammed control. MICRO 1989: 88-96 - 1988
- [c8]Yashwant K. Malaiya, Sheng Feng:
Design of a testable RISC-to-CISC control architecture. MICRO 1988: 57-59 - 1987
- [c7]Rochit Rajsuman, Yashwant K. Malaiya, Anura P. Jayasumana:
On Accuracy of Switch-Level Modeling of Bridging Faults in Complex Gates. DAC 1987: 244-250 - 1985
- [c6]Yashwant K. Malaiya:
Faults in Microprogrammed and Hardwired Control. ITC 1985: 732 - 1984
- [j4]Yashwant K. Malaiya, Ramesh Narayanaswamy:
Modeling and Testing for Timing Faults in Synchronous Sequential Circuits. IEEE Des. Test 1(4): 62-74 (1984) - [c5]Yashwant K. Malaiya, Shoubao Yang:
The Coverage Problem for Random Testing. ITC 1984: 237-245 - 1983
- [c4]Yashwant K. Malaiya, Ramesh Narayanaswamy:
Testing for Timing Faults in Synchronous Sequential Integrated Circuits. ITC 1983: 560-573 - 1982
- [c3]Yashwant K. Malaiya, Stephen Y. H. Su:
A New Fault Model and Testing Technique for CMOS Devices. ITC 1982: 25-34 - 1981
- [j3]Yashwant K. Malaiya, Stephen Y. H. Su:
Reliability Measure of Hardware Redundancy Fault-Tolerant Digital Systems with Intermittent Faults. IEEE Trans. Computers 30(8): 600-604 (1981) - [j2]Chi-Chang Liaw, Stephen Y. H. Su, Yashwant K. Malaiya:
Test-Experiments for Detection and Location of Intermittent Faults in Sequential Circuits. IEEE Trans. Computers 30(12): 989-995 (1981) - [c2]Chi-Chang Liaw, Stephen Y. H. Su, Yashwant K. Malaiya:
State Diagram Approach for Functional Testing of Control Section. ITC 1981: 433-446
1970 – 1979
- 1979
- [c1]Yashwant K. Malaiya, Stephen Y. H. Su:
A survey of methods for intermittent fault analysis. MARK 1979: 577-586 - 1978
- [j1]Stephen Y. H. Su, Israel Koren, Yashwant K. Malaiya:
A Continous-Parameter Markov Model and Detection Procedures for Intermittent Faults. IEEE Trans. Computers 27(6): 567-570 (1978)
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from 
to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the 
of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from 
, 
, and 
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from 
.
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-04-24 23:10 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
