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ORCIDIEEE Transactions on Reliability, Volume 51
Volume 51, Number 1, March 2002
- Ralph A. Evans:
Editorial - fault-trees and cause-consequence charts. 1 - Ralph A. Evans:
Editorial - belling the cat, revisited. 2 - Donald S. Jackson, Himanshu Pant, Michael Tortorella:
Improved reliability-prediction and field-reliability-data analysis for field-replaceable units. 8-16 - J. Hariharan Nair, Sanjeev V. Sabnis:
A reliability test-plan for series systems with components having stochastic failure rates. 17-22 - K. Muralidharan:
Reliability inferences of modulated power-law process #i. 23-26 - Vilijandas Bagdonavicius
, Léo Gerville-Réache, Mikhail Nikulin:
Parametric inference for step-stress models. 27-31 - Stephen R. Cain:
Distinguishing between lognormal and Weibull distributions [time-to-failure data]. 32-38 - A. V. Ramesh, David W. Twigg, Upender R. Sandadi, Tilak C. Sharma:
Reliability analysis of systems with operation-time management. 39-48 - Kent Fitzgerald, Shahram Latifi, Pradip K. Srimani:
Reliability modeling and assessment of the Star-Graph networks. 49-57 - Min-Sheng Lin:
A linear-time algorithm for computing K-terminal reliability on proper interval graphs. 58-62 - Nahmsuk Oh, Philip P. Shirvani, Edward J. McCluskey:
Error detection by duplicated instructions in super-scalar processors. 63-75 - Geert Deconinck, Vincenzo De Florio, Theodora A. Varvarigou, Evangelos Verentziotis:
The EFTOS approach to dependability in embedded supercomputing. 76-90 - Joseph Kreimer:
Effectiveness-analysis of real-time data acquisition and processing multichannel systems. 91-99 - Nohpill Park, Fabrizio Lombardi:
Analysis of stratified testing for multichip module systems. 100-110 - Nahmsuk Oh, Philip P. Shirvani, Edward J. McCluskey:
Control-flow checking by software signatures. 111-122 - Alfredo Benso, Silvia Chiusano, Giorgio Di Natale, Paolo Prinetto:
An on-line BIST RAM architecture with self-repair capabilities. 123-128
Volume 51, Number 2, June 2002
- Rene L. Bierbaum, Thomas D. Brown, Thomas J. Kerschen:
Model-based reliability analysis. 133-140 - Antoine Grall, Laurence Dieulle, Christophe Bérenguer, Michel Roussignol:
Continuous-time predictive-maintenance scheduling for a deteriorating system. 141-150 - Stephen W. Ormon, C. Richard Cassady, Allen G. Greenwood:
Reliability prediction models to support conceptual design. 151-157 - Geert Deconinck, Vincenzo De Florio, Oliver Botti:
Software-implemented fault-tolerance and separate recovery strategies enhance maintainability [substation automation]. 158-165 - Mitchell J. Mondro:
Approximation of mean time between failure when a system has periodic maintenance. 166-167 - Maxim S. Finkelstein, Vladimir I. Zarudnij:
Laplace-transforms and fast-repair approximations for multiple availability and its generalizations. 168-176 - Siew-Leng Teng, Kwee-Poo Yeo:
A least-squares approach to analyzing life-stress relationship in step-stress accelerated life tests. 177-182 - Michael R. Lyu, Sampath Rangarajan, Aad P. A. van Moorsel:
Optimal allocation of test resources for software reliability growth modeling in software development. 183-192 - Yonghuan Cao, Hairong Sun, Kishor S. Trivedi, James J. Han:
System availability with non-exponentially distributed outages. 193-198 - Liudong Xing, Joanne Bechta Dugan:
Analysis of generalized phased-mission system reliability, performance, and sensitivity. 199-211 - Abdulla A. Alhadeed, Shie-Shien Yang:
Optimal simple step-stress plan for Khamis-Higgins model. 212-215 - Michael E. Robinson, Martin Crowder:
The use of residuals in statistical modeling for fatigue-crack growth under constant amplitude loading. 216-222 - Yuan Lin Zhang:
A geometric-process repair-model with good-as-new preventive repair. 223-228 - Fabien Houéto, Samuel Pierre, Ronald Beaubrun, Yves Lemieux:
Reliability and cost evaluation of third-generation wireless access network topologies: a case study. 229-239 - Leila Meshkat, Joanne Bechta Dugan, John D. Andrews:
Dependability analysis of systems with on-demand and active failure modes, using dynamic fault trees. 240-251 - Gianpaolo Pulcini:
Correction to "How to model reliability-growth when times of design modifications are known". 252-253
Volume 51, Number 3, September 2002
- Ralph A. Evans:
Bias is not bad. 257 - Ralph A. Evans:
Data, data, oh where art thou data? 259 - Ralph A. Evans:
A contract is a piece of software. 260 - Chin-Yu Huang, Sy-Yen Kuo:
Analysis of incorporating logistic testing-effort function into software reliability modeling. 261-270 - Ellen Overton McSorley, Jye-Chyi Lu, Chin-Shang Li:
Performance of parameter-estimates in step-stress accelerated life-tests with various sample-sizes. 271-277 - Jussi K. Vaurio:
Treatment of general dependencies in system fault-tree and risk analysis. 278-287 - Guangbin Yang:
Environmental-stress-screening using degradation measurements. 288-293 - Roger M. Cooke, Tim Bedford:
Reliability databases in perspective. 294-310 - Xiaolin Teng, Hoang Pham:
A software-reliability growth model for N-version programming systems. 311-321 - Lisa M. Maillart, Stephen M. Pollock:
Cost-optimal condition-monitoring for predictive maintenance of 2-phase systems. 322-330 - Koji Hisada, Ikuo Arizino:
Reliability tests for Weibull distribution with varying shape-parameter, based on complete data. 331-336 - Ahmed A. Soliman:
Reliability estimation in a generalized life-model with application to the Burr-XII. 337-343 - Lisa M. Bartlett, John D. Andrews:
Choosing a heuristic for the "fault tree to binary decision diagram" conversion, using neural networks. 344-349 - Gordon F. Hughes, Joseph F. Murray, Kenneth Kreutz-Delgado, Charles Elkan:
Improved disk-drive failure warnings. 350-357 - Beatrice Giglio, Daniel Q. Naiman, Henry P. Wynn:
Grobner bases, abstract tubes, and inclusion-exclusion reliability bounds. 358-366 - Mamidala Jagadesh Kumar, Vikram Verma:
Elimination of bipolar induced drain breakdown and single transistor latch in submicron PD SOI MOSFET. 367-370 - Georgia-Ann Klutke, Yoonjung Yang:
The availability of inspected systems subject to shocks and graceful degradation. 371-374 - John B. Bowles:
Commentary-caution: constant failure-rate models may be hazardous to your design. 375-377 - Suprasad V. Amari:
Addendum to: generic rules to evaluate system-failure frequency. 378-379 - Ted W. Yellman:
Commentary-two reliability war stories. 380-381
Volume 51, Number 4, December 2002
- Gang Chen, Ming Fu Li, Ying Jin:
Interaction of interface-traps located at various sites in MOSFETs under stress. 387-391 - Nahmsuk Oh, Edward J. McCluskey:
Error detection by selective procedure call duplication for low energy consumption. 392-402 - Ennis T. Ogawa, Ki-Don Lee, Volker A. Blaschke, Paul S. Ho:
Electromigration reliability issues in dual-damascene Cu interconnections. 403-419 - Yashwant K. Malaiya, Michael Naixin Li, James M. Bieman, Rick Karcich:
Software reliability growth with test coverage. 420-426 - Hong-Fwu Yu, Chih-Hua Chiao:
An optimal designed degradation experiment for reliability improvement. 427-433 - Jonás D. Pfefferman, Bruno Cernuschi-Frías:
A nonparametric nonstationary procedure for failure prediction. 434-442 - Fu-Min Yeh, Shyue-Kung Lu, Sy-Yen Kuo:
OBDD-based evaluation of k-terminal network reliability. 443-451 - Franco Pellerey, Kyriakos I. Petakos:
Closure property of the NBUC class under formation of parallel systems. 452-454 - Taghi M. Khoshgoftaar, Edward B. Allen, Jianyu Deng:
Using regression trees to classify fault-prone software modules. 455-462 - Guangbin Yang, Kai Yang:
Accelerated degradation-tests with tightened critical values. 463-468 - Wei-Ting Kary Chen, Charles Hung-Jia Huang:
Practical "building-in reliability" approaches for semiconductor manufacturing. 469-481 - Jeffrey A. Mittereder, Jason A. Roussos, Wallace T. Anderson, Dimitrios E. Ioannou:
Quantitative measurement of channel temperature of GaAs devices for reliable life-time prediction. 482-485 - Cornel Bunea, Tim Bedford:
The effect of model uncertainty on maintenance optimization. 486-493 - Mehrdad Nourani, Amir Attarha:
Detecting signal-overshoots for reliability analysis in high-speed system-on-chips. 494-504
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