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"An analysis and testing of operation induced faults in MOS VLSI."

Rochit Rajsuman et al. (1991)

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DOI: 10.1109/VTEST.1991.208148

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/RajsumanJMP91
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  - https://dblp.org/rec/conf/vts/RajsumanJMP91
Rochit Rajsuman, Anura P. Jayasumana, Yashwant K. Malaiya, Juney Park:
An analysis and testing of operation induced faults in MOS VLSI. VTS 1991: 137-142

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