Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Testable design of BiCMOS circuits for stuck-open fault detection using ..."

Sankaran M. Menon et al. (1995)

> Home

Details and statistics

DOI: 10.1109/4.400427

access: closed

type: Journal Article

metadata version: 2023-05-03

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jssc/MenonMJR95
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jssc/MenonMJR95
Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Rochit Rajsuman:
Testable design of BiCMOS circuits for stuck-open fault detection using single patterns. IEEE J. Solid State Circuits 30(8): 855-863 (1995)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.