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Journal Articles
- 2018
[j8]Omar Chihani, L. Théolier
, Alain Bensoussan, Jean-Yves Delétage, André Durier, Eric Woirgard:
Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stresses. Microelectron. Reliab. 88-90: 402-405 (2018)- 2017
- [j7]Wissam Sabbah, Faical Arabi, Oriol Avino-Salvado, Cyril Buttay, L. Théolier, Hervé Morel:
Lifetime of power electronics interconnections in accelerated test conditions: High temperature storage and thermal cycling. Microelectron. Reliab. 76-77: 444-449 (2017) - 2016
- [j6]Faical Arabi, Loic Théolier, Donatien Martineau, Jean-Yves Delétage, M. Medina, Eric Woirgard:
Power electronic assemblies: Thermo-mechanical degradations of gold-tin solder for attaching devices. Microelectron. Reliab. 64: 409-414 (2016) - 2015
- [j5]Eric Woirgard, Faical Arabi, Wissam Sabbah, Donatien Martineau, L. Théolier, Stephane Azzopardi:
Identification and analysis of power substrates degradations subjected to severe aging tests. Microelectron. Reliab. 55(9-10): 1961-1965 (2015) - [j4]F. Baccar, Houssam Arbess, L. Théolier, Stephane Azzopardi, Eric Woirgard:
Ageing mechanisms in Deep Trench Termination (DT2) Diode. Microelectron. Reliab. 55(9-10): 1981-1987 (2015) - [j3]Houssam Arbess, F. Baccar, L. Théolier, Stephane Azzopardi, Eric Woirgard:
Mechanical stress investigation after technological process in Deep Trench Termination DT2 using BenzoCycloButene as dielectric material. Microelectron. Reliab. 55(9-10): 2017-2021 (2015) - 2013
- [j2]F. Baccar, Stephane Azzopardi, L. Théolier, K. El Boubkari, Jean-Yves Delétage, Eric Woirgard:
Electrical characterization under mechanical stress at various temperatures of PiN power diodes in a health monitoring approach. Microelectron. Reliab. 53(9-11): 1719-1724 (2013) - 2008
- [j1]L. Théolier, Karine Isoird, H. Tranduc, Frederic Morancho, Jaume Roig, Yann Weber, Evgueniy N. Stefanov, Jean-Michel Reynes:
Switching performance of 65 V vertical N-channel FLYMOSFETs. Microelectron. J. 39(6): 914-921 (2008)
Conference and Workshop Papers
- 2018
- [c1]Omar Chihani, Loic Théolier, Jean-Yves Delétage, Eric Woirgard, Alain Bensoussan, André Durier:
Temperature and voltage effects on HTRB and HTGB stresses for AlGaN/GaN HEMTs. IRPS 2018: 2-1
Coauthor Index
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