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Jean-Michel Reynes
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2010 – 2019
- 2019
- [c1]Quang Chuc Nguyen, Patrick Tounsi, Jean-Pierre Fradin, Jean-Michel Reynes:
Development of SiC MOSFET Electrical Model and Experimental Validation: Improvement and Reduction of Parameter Number. MIXDES 2019: 298-301 - 2013
- [j4]Toufik Azoui, Patrick Tounsi, Jean-Marie Dorkel, Jean-Michel Reynes, Jean-Luc Massol, E. Pomes:
Estimation of power MOSFET junction temperature during avalanche mode: Experimental tests and modelling. Microelectron. Reliab. 53(9-11): 1750-1754 (2013)
2000 – 2009
- 2008
- [j3]L. Théolier, Karine Isoird
, H. Tranduc, Frederic Morancho, Jaume Roig, Yann Weber, Evgueniy N. Stefanov, Jean-Michel Reynes:
Switching performance of 65 V vertical N-channel FLYMOSFETs. Microelectron. J. 39(6): 914-921 (2008) - 2007
- [j2]Yann Weber, Jaume Roig, Jean-Michel Reynes, Frederic Morancho, Evgueniy N. Stefanov, Monique Dilhan, Gérard Sarrabayrouse:
Characterisation of P floating islands for 150-200 V FLYMOSFETs. IET Circuits Devices Syst. 1(5): 333-340 (2007) - 2003
- [j1]Adeline Feybesse, Ivana Deram, Jean-Michel Reynes, Eric Moreau:
Copper metallization influence on power MOS reliability. Microelectron. Reliab. 43(4): 571-576 (2003)
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