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Michél Simon-Najasek
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Journal Articles
- 2018
- [j8]Maximilian Dammann, Martina Baeumler, Peter Brückner
, Tobias Kemmer
, Helmer Konstanzer, Andreas Graff, Michél Simon-Najasek, Rüdiger Quay
:
Comparison of reliability of 100 nm AlGaN/GaN HEMTs with T-gate and SAG-gate technology. Microelectron. Reliab. 88-90: 385-388 (2018) - 2017
- [j7]Maximilian Dammann, Martina Baeumler, Vladimir Polyakov, Peter Brückner
, Helmer Konstanzer, Rüdiger Quay
, Michael Mikulla, Andreas Graff, Michél Simon-Najasek:
Reliability of 100 nm AlGaN/GaN HEMTs for mm-wave applications. Microelectron. Reliab. 76-77: 292-297 (2017) - [j6]Andreas Graff, Michél Simon-Najasek, Frank Altmann
, Ján Kuzmík, Dagmar Gregusová
, S. Hascik, Helmut Jung, T. Baur, Jan Grünenpütt, Hervé Blanck:
High resolution physical analysis of ohmic contact formation at GaN-HEMT devices. Microelectron. Reliab. 76-77: 338-343 (2017) - 2016
- [j5]Michél Simon-Najasek, Georg Lorenz, Achim Lindner, Frank Altmann
:
Novel failure mode of chip corrosion at automotive HALL sensor devices under multiple stress conditions. Microelectron. Reliab. 64: 248-253 (2016) - [j4]Sebastian Brand
, Michél Simon-Najasek, Michael Kögel, Joerg Jatzkowski, R. Portius, Frank Altmann
:
Detection and analysis of stress-induced voiding in Al-power lines by acoustic GHz-microscopy. Microelectron. Reliab. 64: 341-345 (2016) - [j3]Mikael Broas, Andreas Graff, Michél Simon-Najasek, David Poppitz, Frank Altmann
, Helmut Jung, Hervé Blanck:
Correlation of gate leakage and local strain distribution in GaN/AlGaN HEMT structures. Microelectron. Reliab. 64: 541-546 (2016) - 2014
- [j2]Michél Simon-Najasek, Susanne Hübner, Frank Altmann
, Andreas Graff:
Advanced FIB sample preparation techniques for high resolution TEM investigations of HEMT structures. Microelectron. Reliab. 54(9-10): 1785-1789 (2014) - 2012
- [j1]Joerg Jatzkowski, Michél Simon-Najasek, Frank Altmann
:
Novel techniques for dopant contrast analysis on real IC structures. Microelectron. Reliab. 52(9-10): 2098-2103 (2012)
Conference and Workshop Papers
- 2021
- [c4]Maximilian Dammann, Martina Baeumler, Tobias Kemmer, Helmer Konstanzer, Peter Brückner, Sebastian Krause
, Andreas Graff, Michél Simon-Najasek:
Reliability and Failure Analysis of 100 nm AlGaN/GaN HEMTs under DC and RF Stress. IRPS 2021: 1-7 - 2020
- [c3]Enrico Zanoni
, Matteo Meneghini, Gaudenzio Meneghesso, Fabiana Rampazzo, Daniele Marcon, Veronica Gao Zhan, Francesca Chiocchetta, Andreas Graff, Frank Altmann
, Michél Simon-Najasek, David Poppitz:
Reliability Physics of GaN HEMT Microwave Devices: The Age of Scaling. IRPS 2020: 1-10 - 2019
- [c2]Norbert Herfurth, Anne Beyreuther, Elham Amini
, Christian Boit, Michél Simon-Najasek, Susanne Hübner, Frank Altmann
, R. Herfurth, Chen Wu, Ingrid De Wolf
, Kris Croes:
New Access to Soft Breakdown Parameters of Low-k Dielectrics Through Localisation-Based Analysis. IRPS 2019: 1-9 - 2018
- [c1]Andreas Graff, Michél Simon-Najasek, David Poppitz, Frank Altmann
:
Physical failure analysis methods for wide band gap semiconductor devices. IRPS 2018: 3
Coauthor Index
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