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"Comparison of reliability of 100 nm AlGaN/GaN HEMTs with T-gate and ..."
Maximilian Dammann et al. (2018)
- Maximilian Dammann, Martina Baeumler, Peter Brückner
, Tobias Kemmer
, Helmer Konstanzer, Andreas Graff, Michél Simon-Najasek, Rüdiger Quay
:
Comparison of reliability of 100 nm AlGaN/GaN HEMTs with T-gate and SAG-gate technology. Microelectron. Reliab. 88-90: 385-388 (2018)
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