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"Reliability and Failure Analysis of 100 nm AlGaN/GaN HEMTs under DC and RF ..."
Maximilian Dammann et al. (2021)
- Maximilian Dammann, Martina Baeumler, Tobias Kemmer, Helmer Konstanzer, Peter Brückner, Sebastian Krause
, Andreas Graff, Michél Simon-Najasek:
Reliability and Failure Analysis of 100 nm AlGaN/GaN HEMTs under DC and RF Stress. IRPS 2021: 1-7
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