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ORCIDNektar Xama
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Publications
- 2023
[j5]Nektar Xama
, Jhon Gomez, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen:
Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(10): 3426-3435 (2023)- [c11]Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen:
High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis. ETS 2023: 1-4 - 2022
- [j4]Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen:
DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using the Difference in Distance to Mean Value. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(11): 4771-4781 (2022) - 2020
- [j3]Nektar Xama, Martin Andraud, Jhon Gomez, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen:
Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations. ACM Trans. Design Autom. Electr. Syst. 25(5): 47:1-47:27 (2020) - [c10]Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen:
Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing. ETS 2020: 1-6 - [c9]Nektar Xama, Jakob Raymaekers, Martin Andraud, Jhon Gomez, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen:
Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate Statistics. ETS 2020: 1-6 - [c8]Stephen Sunter, Michal Wolinski, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Nektar Xama, Jhon Gomez, Georges G. E. Gielen:
Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs. ITC 2020: 1-10 - [c7]Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen:
Pinhole Latent Defect Modeling and Simulation for Defect-Oriented Analog/Mixed-Signal Testing. VTS 2020: 1-6 - 2019
- [c5]Wim Dobbelaere, Frederik Colle, Anthony Coyette, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen:
Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs. ITC 2019: 1-4 - 2018
- [j2]Baris Esen, Anthony Coyette, Nektar Xama, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren:
An Automated Low-Cost Analog and Mixed-Signal DfT Method Using Testing Diodes. IEEE Des. Test 35(3): 15-23 (2018) - [j1]Anthony Coyette, Baris Esen, Nektar Xama, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren:
ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal Integrated Circuits. IEEE Des. Test 35(3): 24-30 (2018) - [c4]Georges G. E. Gielen, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Nektar Xama:
Methodology Towards Sub-ppm Testing of Analog and Mixed-Signal ICs for Cyber-Physical Systems. ISCAS 2018: 1-4 - 2017
- [c3]Baris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen:
A very low cost and highly parallel DfT method for analog and mixed-signal circuits. ETS 2017: 1-2 - [c2]Nektar Xama, Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen:
Automatic testing of analog ICs for latent defects using topology modification. ETS 2017: 1-6 - [c1]Baris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen:
Non-intrusive detection of defects in mixed-signal integrated circuits using light activation. ITC 2017: 1-7
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