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"Machine Learning-based Defect Coverage Boosting of Analog Circuits under ..."

Nektar Xama et al. (2020)

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DOI: 10.1145/3408063

access: closed

type: Journal Article

metadata version: 2021-10-14

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Nektar Xama, Martin Andraud, Jhon Gomez, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen:
Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations. ACM Trans. Design Autom. Electr. Syst. 25(5): 47:1-47:27 (2020)

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