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"DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using ..."

Jhon Gomez et al. (2022)

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DOI: 10.1109/TCAD.2021.3139311

access: closed

type: Journal Article

metadata version: 2022-11-13

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Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen:
DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using the Difference in Distance to Mean Value. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(11): 4771-4781 (2022)

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