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"Applying Vstress and defect activation coverage to produce zero-defect ..."

Wim Dobbelaere et al. (2019)

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DOI: 10.1109/ITC44170.2019.9000123

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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  - conf/itc/DobbelaereCCVXG19
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  - https://dblp.org/rec/conf/itc/DobbelaereCCVXG19
Wim Dobbelaere, Frederik Colle, Anthony Coyette, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen:
Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs. ITC 2019: 1-4

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