Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Automatic testing of analog ICs for latent defects using topology ..."

Nektar Xama et al. (2017)

> Home

Details and statistics

DOI: 10.1109/ETS.2017.7968215

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-19

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/ets/XamaCEDVG17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ets/XamaCEDVG17
Nektar Xama, Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen:
Automatic testing of analog ICs for latent defects using topology modification. ETS 2017: 1-6

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.