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"Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM ..."

Nektar Xama et al. (2023)

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DOI: 10.1109/TCAD.2023.3244892

access: closed

type: Journal Article

metadata version: 2023-10-14

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  - https://dblp.org/rec/journals/tcad/XamaGDVCG23
Nektar Xama, Jhon Gomez, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen:
Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(10): 3426-3435 (2023)

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