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ORCIDRui Liu 0011
Person information
- affiliation: University of Saskatchewan, Department of Electrical and Computer Engineering, Saskatoon, Canada
Other persons with the same name
- Rui Liu — disambiguation page
- Rui Liu 0001 — University of Delaware, Department of Computer and Information Sciences, Newark, DE, USA
- Rui Liu 0002
![[0000-0001-9061-787X]](https://dblp1.uni-trier.de/img/orcid-mark.12x12.png "0000-0001-9061-787X")
— University of Chicago, Department of Computer Science, IL, USA (and 3 more) - Rui Liu 0003 — Colorado School of Mines, Department of Mechanical Engineering, Golden, CO, USA
- Rui Liu 0004 — National University of Singapore (and 1 more)
- Rui Liu 0005 — Arizona State University, School of Electrical, Computer, and Energy Engineering, Tempe, AZ, USA
- Rui Liu 0006 — Louisiana Tech University, Ruston, LA, USA
- Rui Liu 0007 — Beihang University, School of Computer Science and Engineering, State Key Lab of Software Development Environment, Beijing, China
- Rui Liu 0008 — Inner Mongolia University, College of Computer Science, Hohhot, China
- Rui Liu 0009 — South China University of Technology, School of Mathematics, Guangzhou, China (and 2 more)
- Rui Liu 0010 — Technical University Munich, Germany
- Rui Liu 0012 — The Second Xiangya Hospital of Central South University, Department of Oncology, Hunan, China
- Rui Liu 0013 — University of Michigan, Ann Arbor, MI, USA
- Rui Liu 0014 — Dartmouth College, Hanover, NH, USA (and 2 more)
- Rui Liu 0015 — Dalian University, School of Software Engineering, China
- Rui Liu 0016 — Zhejiang University, College of Information Science and Electronic Engineering, Hangzhou, China
- Rui Liu 0017 — University of California San Diego, Department of Physics, CA, USA (and 1 more)
- Rui Liu 0018 — Chang'an University, School of Automobile, Xi'an, China (and 1 more)
- Rui Liu 0019 — Chinese University of Hong Kong, Department of Electrical Engineering, CUHK-SenseTime Joint Laboratory, Hong Kong (and 1 more)
- Rui Liu 0020 — Beihang University, Sino-German Joint Software Institute, Beijing, China
- Rui Liu 0021 — North China Electric Power University, Beijing, China
- Rui Liu 0022 — Harbin Institute of Technology, Shenzhen Graduate School, China (and 1 more)
- Rui Liu 0023 — Ningxia University, School of Agriculture, Yinchuan, China
- Rui Liu 0024 — North University of China, MOE Key Laboratory of Instrumentation Science and Dynamic Measurement, Taiyuan, China
- Rui Liu 0025 — Beihang University, School of Mechanical Engineering and Automation, Beijing, China
- Rui Liu 0026 — Nanjing Tech University, School of Mechanical and Power Engineering, China (and 1 more)
- Rui Liu 0027 — Space Engineering University, School of Space Information, Beijing, China
- Rui Liu 0028 — University of Science and Technology Beijing, School of Automation and Electrical Engineering / Institute of Artificial Intelligence, China
- Rui Liu 0029 — Chengdu University of Technology, College of Geophysics, MOE Key Laboratory of Earth Exploration and Information Technology, China
- Rui Liu 0030 — Boston University, Division of Systems Engineering, Quincy, MA, USA (and 1 more)
- Rui Liu 0031 — Indiana University, Department of Computer and Information Science, IN, USA (and 1 more)
- Rui Liu 0032 — Chinese Academy of Sciences, Institute of Information Engineering, China (and 1 more)
- Rui Liu 0033 — City University of Hong Kong, Department of Mechanical Engineering, Hong Kong
- Rui Liu 0034 — Nanyang Technological University, Singapore
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Journal Articles
- 2021
[j8]Shuting Shi, Rui Chen, Rui Liu, Mo Chen, Chen Shen, Xuantian Li, Haonan Tian, Li Chen:
Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor. J. Electron. Test. 37(2): 271-278 (2021)- 2018
- [j7]Yuanqing Li, Li Chen, Issam Nofal, Mo Chen, Haibin Wang, Rui Liu, Qingyu Chen, Milos Krstic, Shuting Shi, Gang Guo, Sang H. Baeg, Shi-Jie Wen, Richard Wong:
Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree. Microelectron. Reliab. 87: 24-32 (2018) - 2016
- [j6]Yuanqing Li, Haibin Wang, Lixiang Li, Li Chen, Rui Liu, Mo Chen:
A Built-in Single Event Upsets Detector for Sequential Cells. J. Electron. Test. 32(1): 11-20 (2016) - [j5]Yuanqing Li, Lixiang Li, Yuan Ma, Li Chen, Rui Liu, Haibin Wang, Qiong Wu, Michael Newton, Mo Chen:
A 10-Transistor 65 nm SRAM Cell Tolerant to Single-Event Upsets. J. Electron. Test. 32(2): 137-145 (2016) - [j4]Qingyu Chen, Haibin Wang, Li Chen, Lixiang Li, Xing Zhao, Rui Liu, Mo Chen, Xuantian Li:
An SEU-Resilient SRAM Bitcell in 65-nm CMOS Technology. J. Electron. Test. 32(3): 385-391 (2016) - 2015
- [j3]Haibin Wang, Rui Liu, Li Chen, Jinshun Bi, Mulong Li, Yuanqing Li:
A Novel Built-in Current Sensor for N-WELL SET Detection. J. Electron. Test. 31(4): 395-401 (2015) - [j2]Lixiang Li, Yuanqing Li, Haibin Wang, Rui Liu, Qiong Wu, Michael Newton, Yuan Ma, Li Chen:
Simulation and Experimental Evaluation of a Soft Error Tolerant Layout for SRAM 6T Bitcell in 65nm Technology. J. Electron. Test. 31(5-6): 561-568 (2015) - 2014
- [j1]Haibin Wang, Mulong Li, Li Chen, Rui Liu, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Rita Fung, Jinshun Bi:
Single Event Resilient Dynamic Logic Designs. J. Electron. Test. 30(6): 751-761 (2014)
Conference and Workshop Papers
- 2017
- [c4]Issam Nofal, Adrian Evans, Anlin He, Gang Guo, Yuanqing Li, Li Chen, Rui Liu, Haibin Wang, Mo Chen, Sang H. Baeg, Shi-Jie Wen, Richard Wong:
BPPT - Bulk potential protection technique for hardened sequentials. IOLTS 2017: 28-32 - 2016
- [c3]Haibin Wang, Rui Liu, Xuantian Li, Li Chen, David M. Hiemstra, Valeri Kirischian:
Total ionizing dose test facilities for micro-electronic circuits. CCECE 2016: 1-4 - 2015
- [c2]Rui Liu, Adrian Evans, Qiong Wu, Yuanqing Li, Li Chen, Shi-Jie Wen, Rick Wong, Rita Fung:
Analysis of advanced circuits for SET measurement. IRPS 2015: 7 - 2014
- [c1]Hao Xie, Li Chen, Rui Liu, Adrian Evans, Dan Alexandrescu, Shi-Jie Wen, Rick Wong:
New approaches for synthesis of redundant combinatorial logic for selective fault tolerance. IOLTS 2014: 62-68
Coauthor Index
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