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Michael Goroll

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2014
[j11]
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  - journals/mr/ReutherPG14
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Georg Michael Reuther, Reinhard Pufall, Michael Goroll:
Acoustic detection of micro-cracks in small electronic devices. Microelectron. Reliab. 54(9-10): 2118-2122 (2014)
2012
[j10]
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Reinhard Pufall, Michael Goroll, Joachim Mahler, Werner Kanert, M. Bouazza, Olaf Wittler, Rainer Dudek:
Degradation of moulding compounds during highly accelerated stress tests - A simple approach to study adhesion by performing button shear tests. Microelectron. Reliab. 52(7): 1266-1271 (2012)
[j9]
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Michael Goroll, Reinhard Pufall:
Determination of adhesion and delamination prediction for semiconductor packages by using Grey Scale Correlation and Cohesive Zone Modelling. Microelectron. Reliab. 52(9-10): 2289-2293 (2012)
2010
[j8]
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Michael Goroll, Reinhard Pufall:
New aspects in characterization of adhesion of moulding compounds on different surfaces by using a simple button-shear-test method for lifetime prediction of power devices. Microelectron. Reliab. 50(9-11): 1684-1687 (2010)
2008
[j7]
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Stefano Aresu, Reinhard Pufall, Michael Goroll, Wolfgang Gustin:
NBTI on smart power technologies: A detailed analysis of two concurrent effects using a re-examined on-the-fly technique. Microelectron. Reliab. 48(8-9): 1310-1312 (2008)
[j6]
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Reinhard Pufall, Werner Kanert, Stefano Aresu, Michael Goroll:
Reduction of test effort. Looking for more acceleration for reliable components for automotive applications. Microelectron. Reliab. 48(8-9): 1490-1493 (2008)
[j5]
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Michael Goroll, Reinhard Pufall, Stefano Aresu, Wolfgang Gustin:
New aspects for lifetime prediction of bipolar transistors in automotive power wafer technologies by using a power law fitting procedure. Microelectron. Reliab. 48(8-9): 1509-1512 (2008)
2007
[j4]
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Stefano Aresu, Werner Kanert, Reinhard Pufall, Michael Goroll:
Exceptional operative gate voltage induces negative bias temperature instability (NBTI) on n-type trench DMOS transistors. Microelectron. Reliab. 47(9-11): 1416-1418 (2007)
[j3]
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Michael Goroll, Werner Kanert, Reinhard Pufall, Stefano Aresu:
Analysis of ESD protection structure behaviour after ageing as new approach for system level reliability of automotive power devices. Microelectron. Reliab. 47(9-11): 1512-1516 (2007)
2006
[j2]
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Michael Goroll, Werner Kanert, Reinhard Pufall:
ESD protection structure qualification - a new approach for release for automotive applications. Microelectron. Reliab. 46(9-11): 1648-1651 (2006)
2004
[j1]
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Michael Goroll, Reinhard Pufall, Werner Kanert, Boris Plikat:
Semiconductors in high temperature applications - a future trend in automotive industry. Microelectron. Reliab. 44(9-11): 1413-1417 (2004)

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