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"Reduction of test effort. Looking for more acceleration for reliable ..."

Reinhard Pufall et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.07.034

access: closed

type: Journal Article

metadata version: 2020-02-22

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Reinhard Pufall, Werner Kanert, Stefano Aresu, Michael Goroll:
Reduction of test effort. Looking for more acceleration for reliable components for automotive applications. Microelectron. Reliab. 48(8-9): 1490-1493 (2008)

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