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"Exceptional operative gate voltage induces negative bias temperature ..."
Stefano Aresu et al. (2007)
- Stefano Aresu, Werner Kanert, Reinhard Pufall, Michael Goroll:
Exceptional operative gate voltage induces negative bias temperature instability (NBTI) on n-type trench DMOS transistors. Microelectron. Reliab. 47(9-11): 1416-1418 (2007)
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