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ORCIDRita Fung
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- affiliation: Cisco Systems, San Jose, CA, USA
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Journal Articles
- 2014
[j1]Haibin Wang, Mulong Li, Li Chen
, Rui Liu, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Rita Fung, Jinshun Bi:
Single Event Resilient Dynamic Logic Designs. J. Electron. Test. 30(6): 751-761 (2014)
Conference and Workshop Papers
- 2022
- [c9]Yoni Xiong, Alexandra Feeley, Nicholas J. Pieper, Dennis R. Ball, Balaji Narasimham, John Brockman, N. A. Dodds, S. A. Wender, Shi-Jie Wen, Rita Fung, Bharat L. Bhuva:
Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment. IRPS 2022: 7 - 2021
- [c8]Alexandra Feeley, Yoni Xiong, Bharat L. Bhuva, Balaji Narasimham, Shi-Ji Wen, Rita Fung:
Effects of Temperature and Supply Voltage on Soft Errors for 7-nm Bulk FinFET Technology. IRPS 2021: 1-5 - [c7]Yoni Xiong, Alexandra Feeley, Lloyd W. Massengill, Bharat L. Bhuva, Shi-Jie Wen, Rita Fung:
Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node. IRPS 2021: 1-5 - 2020
- [c6]Jingchen Cao, Lyuan Xu, Shi-Jie Wen, Rita Fung, Balaji Narasimham, Lloyd W. Massengill, Bharat L. Bhuva:
Temperature Dependence of Single-Event Transient Pulse Widths for 7-nm Bulk FinFET Technology. IRPS 2020: 1-5 - [c5]Andrew M. Keller, Jared Anderson, Michael J. Wirthlin, Shi-Jie Wen, Rita Fung, Conner Chambers:
Using Partial Duplication With Compare to Detect Radiation-Induced Failure in a Commercial FPGA-Based Networking System. IRPS 2020: 1-6 - [c4]Lyuan Xu, Jingchen Cao, John Brockman, Carlo Cazzaniga, Christopher Frost, Shi-Jie Wen, Rita Fung, Bharat L. Bhuva:
Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node. IRPS 2020: 1-5 - [c3]Lyuan Xu, Jingchen Cao, Shi-Jie Wen, Rita Fung, Jamie Markevitch, Dennis R. Ball, Bharat L. Bhuva:
High-Current State triggered by Operating-Frequency Change. IRPS 2020: 1-4 - 2015
- [c2]Rui Liu, Adrian Evans, Qiong Wu, Yuanqing Li, Li Chen, Shi-Jie Wen, Rick Wong, Rita Fung:
Analysis of advanced circuits for SET measurement. IRPS 2015: 7 - 2013
- [c1]Richard Wong, Rita Fung, Shi-Jie Wen:
Networking industry trends in ESD protection for high speed IOs. ASICON 2013: 1-4
Coauthor Index
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