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"Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology ..."

Yoni Xiong et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764523

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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  - conf/irps/XiongFPBNBDWWFB22
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Yoni Xiong, Alexandra Feeley, Nicholas J. Pieper, Dennis R. Ball, Balaji Narasimham, John Brockman, N. A. Dodds, S. A. Wender, Shi-Jie Wen, Rita Fung, Bharat L. Bhuva:
Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment. IRPS 2022: 7

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