Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Effects of Temperature and Supply Voltage on Soft Errors for 7-nm Bulk ..."

Alexandra Feeley et al. (2021)

> Home

Details and statistics

DOI: 10.1109/IRPS46558.2021.9405124

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-20

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/FeeleyXBNWF21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/FeeleyXBNWF21
Alexandra Feeley, Yoni Xiong, Bharat L. Bhuva, Balaji Narasimham, Shi-Ji Wen, Rita Fung:
Effects of Temperature and Supply Voltage on Soft Errors for 7-nm Bulk FinFET Technology. IRPS 2021: 1-5

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.