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W. Robert Daasch
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Publications
- 2007
- [c23]Ritesh P. Turakhia, W. Robert Daasch, Mark Ward, John Van Slyke:
Silicon evaluation of longest path avoidance testing for small delay defects. ITC 2007: 1-10 - 2006
- [j6]Ritesh P. Turakhia, W. Robert Daasch, Joel Lurkins, Brady Benware:
Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers. IEEE Des. Test Comput. 23(2): 100-109 (2006) - 2005
- [c22]W. Robert Daasch, Robert Madge:
Variance reduction and outliers: statistical analysis of semiconductor test data. ITC 2005: 9 - [c21]W. Robert Daasch, Robert Madge:
Data-driven models for statistical testing: measurements, estimates and residuals. ITC 2005: 10 - [c20]Robert Madge, Brady Benware, Mark Ward, W. Robert Daasch:
The value of statistical testing for quality, yield and test cost improvement. ITC 2005: 10 - [c18]Ritesh P. Turakhia, Brady Benware, Robert Madge, Thaddeus T. Shannon, W. Robert Daasch:
Defect Screening Using Independent Component Analysis on I_DDQ. VTS 2005: 427-432 - 2004
- [c16]Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler:
In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. ITC 2004: 203-212 - [c15]Chris Schuermyer, Jens Ruffler, W. Robert Daasch:
Minimum Testing Requirements to Screen Temperature Dependent Defects. ITC 2004: 300-308 - [c14]W. Robert Daasch, Manu Rehani:
Dude! Where's my data? - Cracking Open the Hermetically Sealed Tester. ITC 2004: 1428 - [c13]Ethan Long, W. Robert Daasch, Robert Madge, Brady Benware:
Detection of Temperature Sensitive Defects Using ZTC. VTS 2004: 185-192 - 2003
- [j5]Robert Madge, Brady Benware, W. Robert Daasch:
Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs. IEEE Des. Test Comput. 20(5): 46-53 (2003) - [c12]Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning:
Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ. ITC 2003: 565-573 - [c11]Brady Benware, Robert Madge, Cam Lu, W. Robert Daasch:
Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs. VTS 2003: 39-46 - 2002
- [j3]W. Robert Daasch, James McNames, Robert Madge, Kevin Cota:
Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort. IEEE Des. Test Comput. 19(5): 74-81 (2002) - [c9]David Turner, David Abercrombie, James McNames, W. Robert Daasch, Robert Madge:
Isolating and Removing Sources of Variation in Test Data. ITC 2002: 464-471 - [c8]Robert Madge, B. H. Goh, V. Rajagopalan, C. Macchietto, W. Robert Daasch, Chris Schuermyer, C. Taylor, David Turner:
Screening MinVDD Outliers Using Feed-Forward Voltage Testing. ITC 2002: 673-682 - [c7]W. Robert Daasch, Kevin Cota, James McNames, Robert Madge:
Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data. ITC 2002: 1240 - [c6]Robert Madge, Manu Rehani, Kevin Cota, W. Robert Daasch:
Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies. VTS 2002: 69-74 - 2001
- [c5]W. Robert Daasch, Kevin Cota, James McNames, Robert Madge:
Neighbor selection for variance reduction in I_DDQ and other parametric data. ITC 2001: 92-100 - 2000
- [c4]W. Robert Daasch, James McNames, Daniel Bockelman, Kevin Cota:
Variance reduction using wafer patterns in I_ddQ data. ITC 2000: 189-198
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