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"The value of statistical testing for quality, yield and test cost improvement."

Robert Madge et al. (2005)

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DOI: 10.1109/TEST.2005.1583990

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/itc/MadgeBWD05
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  persistent URL:
  - https://dblp.org/rec/conf/itc/MadgeBWD05
Robert Madge, Brady Benware, Mark Ward, W. Robert Daasch:
The value of statistical testing for quality, yield and test cost improvement. ITC 2005: 10

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