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"Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a ..."

Robert Madge et al. (2002)

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DOI: 10.1109/VTS.2002.1011113

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Robert Madge, Manu Rehani, Kevin Cota, W. Robert Daasch:
Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies. VTS 2002: 69-74

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