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"Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ..."

Robert Madge, Brady Benware, W. Robert Daasch (2003)

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DOI: 10.1109/MDT.2003.1232256

access: closed

type: Journal Article

metadata version: 2020-05-17

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  - https://dblp.org/rec/journals/dt/MadgeBD03
Robert Madge, Brady Benware, W. Robert Daasch:
Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs. IEEE Des. Test Comput. 20(5): 46-53 (2003)

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