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Publication search results
found 55 matches
- 2010
- Michel Agoyan, Jean-Max Dutertre, Amir-Pasha Mirbaha, David Naccache, Anne-Lise Ribotta, Assia Tria:
How to flip a bit? IOLTS 2010: 235-239 - Sobeeh Almukhaizim, Sara Bunian, Ozgur Sinanoglu:
Reconfigurable low-power Concurrent Error Detection in logic circuits. IOLTS 2010: 206-207 - Josep Altet, Diego Mateo, Eduardo Aldrete-Vidrio:
Thermal coupling in ICs: Applications to the test and characterization of analogue and RF circuits. IOLTS 2010: 135 - Michael Augustin, Michael Gössel, Rolf Kraemer:
Reducing the area overhead of TMR-systems by protecting specific signals. IOLTS 2010: 268-273 - Nicholas Axelos, Kiamal Z. Pekmestzi:
A bit level area aware cache-based architecture for memory repairs. IOLTS 2010: 154-158 - Tiago R. Balen, Marcelo Lubaszewski:
Radiation effects on programmable analog devices and mitigation techniques. IOLTS 2010: 136 - Rodrigo Possamai Bastos, Gilles Sicard, Fernanda Lima Kastensmidt, Marc Renaudin, Ricardo Reis:
Evaluating transient-fault effects on traditional C-element's implementations. IOLTS 2010: 35-40 - Niccolò Battezzati, Davide Serrone, Massimo Violante:
A new framework for the automatic insertion of mitigation structures in circuits netlists. IOLTS 2010: 190-191 - Sebastià A. Bota, Gabriel Torrens, Bartomeu Alorda, Jaume Verd, Jaume Segura:
Cross-BIC architecture for single and multiple SEU detection enhancement in SRAM memories. IOLTS 2010: 141-146 - Kaouthar Bousselam, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
Evaluation of concurrent error detection techniques on the advanced encryption standard. IOLTS 2010: 223-228 - Salvatore Campagna, Massimo Violante:
A framework to support the design of COTS-based reliable space computers for on-board data handling. IOLTS 2010: 91-96 - Raul Chipana, Letícia Maria Veiras Bolzani, Fabian Vargas, Jorge Semião, Juan J. Rodríguez-Andina, Isabel C. Teixeira, João Paulo Teixeira:
Investigating the Use of BICS to detect resistive-open defects in SRAMs. IOLTS 2010: 200-201 - Shyam Kumar Devarakond, Shreyas Sen, Aritra Banerjee, Vishwanath Natarajan, Abhijit Chatterjee:
Built-in performance monitoring of mixed-signal/RF front ends using real-time parameter estimation. IOLTS 2010: 77-82 - Michael G. Dimopoulos, Alexios Spyronasios, Alkis A. Hatzopoulos:
Wavelet analysis of measurements for on-line testing analog & mixed-signal circuits. IOLTS 2010: 83-87 - Paul Duplys, Eberhard Böhl, Wolfgang Rosenstiel:
Key randomization using a power analysis resistant deterministic random bit generator. IOLTS 2010: 229-234 - Samuel Evain, Yannick Bonhomme, Valentin Gherman:
Programmable restricted SEC codes to mask permanent faults in semiconductor memories. IOLTS 2010: 147-153 - Navid Farazmand, Masoud Zamani, Mehdi Baradaran Tahoori:
Online fault testing of reversible logic using dual rail coding. IOLTS 2010: 204-205 - Etienne Faure, Mounir Benabdenbi, François Pêcheux:
Distributed online software monitoring of manycore architectures. IOLTS 2010: 56-61 - Sreenivas Gangadhar, Spyros Tragoudas:
Probabilistic methods for the impact of an SET in combinational logic. IOLTS 2010: 41-46 - Piotr Gawkowski, Tomasz Rutkowski, Janusz Sosnowski:
Improving fault handling software techniques. IOLTS 2010: 197-199 - Michelangelo Grosso, Matteo Sonza Reorda, Marta Portela-García, Mario García-Valderas, Celia López-Ongil, Luis Entrena:
An on-line fault detection technique based on embedded debug features. IOLTS 2010: 167-172 - Olivier Héron, Julien Guilhemsang, Nicolas Ventroux, Alain Giulieri:
Analysis of on-line self-testing policies for real-time embedded multiprocessors in DSM technologies. IOLTS 2010: 49-55 - Georgios Karakonstantis, Charles Augustine, Kaushik Roy:
A self-consistent model to estimate NBTI degradation and a comprehensive on-line system lifetime enhancement technique. IOLTS 2010: 3-8 - Seyab Khan, Said Hamdioui:
Temperature dependence of NBTI induced delay. IOLTS 2010: 15-20 - Dzmitry Maliuk, Haralampos-G. D. Stratigopoulos, Yiorgos Makris:
An analog VLSI multilayer perceptron and its application towards built-in self-test in analog circuits. IOLTS 2010: 71-76 - David R. McIntyre, Francis G. Wolff, Christos A. Papachristou, Swarup Bhunia:
Trustworthy computing in a multi-core system using distributed scheduling. IOLTS 2010: 211-213 - Andreas Merentitis, Dionisis Margaris, Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos:
SBST for on-line detection of hard faults in multiprocessor applications under energy constraints. IOLTS 2010: 62-67 - Nikolaos Minas, Ingrid De Wolf, Erik Jan Marinissen, Michele Stucchi, Herman Oprins, Abdelkarim Mercha, Geert Van der Plas, Dimitrios Velenis, Pol Marchal:
3D integration: Circuit design, test, and reliability challenges. IOLTS 2010: 217 - Michael Nicolaidis, Vladimir Pasca, Lorena Anghel:
Interconnect Built-In Self-Repair and Adaptive-Serialization (I-BIRAS) for 3D integrated systems. IOLTS 2010: 218 - Ryoji Noji, Satoshi Fujie, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue:
An FPGA-based fail-soft system with adaptive reconfiguration. IOLTS 2010: 127-132
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