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"Programmable restricted SEC codes to mask permanent faults in ..."

Samuel Evain, Yannick Bonhomme, Valentin Gherman (2010)

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DOI: 10.1109/IOLTS.2010.5560216

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/iolts/EvainBG10
Samuel Evain, Yannick Bonhomme, Valentin Gherman:
Programmable restricted SEC codes to mask permanent faults in semiconductor memories. IOLTS 2010: 147-153

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