"Investigating the Use of BICS to detect resistive-open defects in SRAMs."

Raul Chipana et al. (2010)

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DOI: 10.1109/IOLTS.2010.5560207

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Raul Chipana, Letícia Maria Veiras Bolzani, Fabian Vargas, Jorge Semião, Juan J. Rodríguez-Andina, Isabel C. Teixeira, João Paulo Teixeira:
Investigating the Use of BICS to detect resistive-open defects in SRAMs. IOLTS 2010: 200-201

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