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Eduardo Aldrete-Vidrio
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2010 – 2019
- 2014
- [c5]Josep Altet
, Eduardo Aldrete-Vidrio, Ferran Reverter, Didac Gómez, José Luis González, Marvin Onabajo, José Silva-Martínez, B. Martineau, X. Perpiñà
, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Xavier Aragonès
, Xavier Jordà
, Miquel Vellvehí
, Stefan Dilhaire, Salvador Mir, Diego Mateo
:
Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes. MWSCAS 2014: 1081-1084 - 2011
- [j3]Marvin Onabajo, Didac Gómez, Eduardo Aldrete-Vidrio, Josep Altet
, Diego Mateo
, José Silva-Martínez:
Survey of Robustness Enhancement Techniques for Wireless Systems-on-a-Chip and Study of Temperature as Observable for Process Variations. J. Electron. Test. 27(3): 225-240 (2011) - [j2]Marvin Onabajo, Josep Altet
, Eduardo Aldrete-Vidrio, Diego Mateo
, José Silva-Martínez:
Electrothermal Design Procedure to Observe RF Circuit Power and Linearity Characteristics With a Homodyne Differential Temperature Sensor. IEEE Trans. Circuits Syst. I Regul. Pap. 58-I(3): 458-469 (2011) - 2010
- [c4]Josep Altet
, Diego Mateo
, Eduardo Aldrete-Vidrio:
Thermal coupling in ICs: Applications to the test and characterization of analogue and RF circuits. IOLTS 2010: 135
2000 – 2009
- 2009
- [c3]Eduardo Aldrete-Vidrio, Marvin Onabajo, Josep Altet
, Diego Mateo
, José Silva-Martínez:
Non-invasive RF built-in testing using on-chip temperature sensors. ITC 2009: 1 - 2008
- [c2]Eduardo Aldrete-Vidrio, M. Amine Salhi, Josep Altet
, Stéphane Grauby
, Diego Mateo
, H. Michel, L. Clerjaud, Jean-Michel Rampnoux, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire:
Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers. ETS 2008: 47-52 - 2007
- [j1]Diego Mateo
, Josep Altet
, Eduardo Aldrete-Vidrio:
Electrical characterization of analogue and RF integrated circuits by thermal measurements. Microelectron. J. 38(2): 151-156 (2007) - 2006
- [c1]Josep Altet, Diego Mateo
, José Luis González, Eduardo Aldrete-Vidrio:
Observation of high-frequency analog/RF electrical circuit characteristics by on-chip thermal measurements. ISCAS 2006
Coauthor Index
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