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Publication search results
found 25 matches
- 2018
- Bakhtiar Ali, Mohd Faizul Mohd Sabri, Suhana Binti Mohd Said, Nazatul Liana Sukiman, Iswadi Jauhari, Mohammad Hossein Mahdavifard:
Microstructural and tensile properties of Fe and Bi added Sn-1Ag-0.5Cu solder alloy under high temperature environment. Microelectron. Reliab. 82: 171-178 (2018) - Marko S. Andjelkovic, Milos Krstic, Rolf Kraemer:
Study of the operation and SET robustness of a CMOS pulse stretching circuit. Microelectron. Reliab. 82: 100-112 (2018) - H. Conseil-Gudla, Zygimantas Staliulionis, Sankhya Mohanty, Morten Stendahl Jellesen, Jesper Henri Hattel, Rajan Ambat:
Humidity build-up in electronic enclosures exposed to different geographical locations by RC modelling and reliability prediction. Microelectron. Reliab. 82: 136-146 (2018) - Danijel Dankovic, Ivica Manic, Aneta Prijic, Vojkan Davidovic, Zoran Prijic, Snezana Golubovic, Snezana Djoric-Veljkovic, Albena Paskaleva, D. Spassov, Ninoslav Stojadinovic:
A review of pulsed NBTI in P-channel power VDMOSFETs. Microelectron. Reliab. 82: 28-36 (2018) - Bing Gao, Fan Yang, Minyou Chen, Yigao Chen, Wei Lai, Chao Liu:
Thermal lifetime estimation method of IGBT module considering solder fatigue damage feedback loop. Microelectron. Reliab. 82: 51-61 (2018) - Darong Huang, Lanyan Ke, Xiaoyan Chu, Ling Zhao, Bo Mi:
Fault diagnosis for the motor drive system of urban transit based on improved Hidden Markov Model. Microelectron. Reliab. 82: 179-189 (2018) - Yunpeng Jia, Zhenhua Lin, Dongqing Hu, Yu Wu, Peng Li, Guanghai Liu:
Micro-Raman spectroscopy applied in crystal structure analysis on the ESD failure mechanism of SiC JBS diodes. Microelectron. Reliab. 82: 37-41 (2018) - Chin-Li Kao, Tei-Chen Chen:
Ball impact responses of Sn-1Ag-0.5Cu solder joints at different temperatures and surface finishes. Microelectron. Reliab. 82: 204-212 (2018) - K. A. Karthigeyan, Premanand Venkatesh Chandramani:
Study and analysis of DR-VCO for rad-hardness in type II third order CPLL. Microelectron. Reliab. 82: 190-196 (2018) - Olarewaju Mubashiru Lawal, Shuhuan Liu, Zhuoqi Li, Aqil Hussain:
60Co gamma radiation total ionizing dose combined with conducted electromagnetic interference studies in BJTs. Microelectron. Reliab. 82: 159-164 (2018) - Xingji Li, Jianqun Yang, Chaoming Liu, Gang Bai, Wenbo Luo, Pengwei Li:
Synergistic effects of NPN transistors caused by combined proton irradiations with different energies. Microelectron. Reliab. 82: 130-135 (2018) - Julien Magnien, Lisa Mitterhuber, Jördis Rosc, Franz Schrank, Stefan Hörth, Matthias Hutter, Stefan Defregger, Elke Kraker:
Parameter driven monitoring for a flip-chip LED module under power cycling condition. Microelectron. Reliab. 82: 84-89 (2018) - Carmen Martin, Alexandre Micol, François Pérès:
Importance of test parameters, specimen type and use configuration on the identification of Sn/Ag solder behaviour laws. Microelectron. Reliab. 82: 213-223 (2018) - S. Nilamani, P. Chitra, V. N. Ramakrishnan:
Topological variation on sub-20 nm double-gate inversion and Junctionless-FinFET based 6T-SRAM circuits and its SEU radiation performance. Microelectron. Reliab. 82: 11-19 (2018) - Clemens Ostermaier, Peter Lagger, M. Reiner, Dionyz Pogany:
Review of bias-temperature instabilities at the III-N/dielectric interface. Microelectron. Reliab. 82: 62-83 (2018) - Stephen M. Ramey, Chetan Prasad, A. Rahman:
Technology scaling implications for BTI reliability. Microelectron. Reliab. 82: 42-50 (2018) - Christian Schlünder, Katja Puschkarsky, Gunnar Andreas Rott, Wolfgang Gustin, Hans Reisinger:
NBTI: Experimental investigation, physical modelling, circuit aging simulations and verification. Microelectron. Reliab. 82: 1-10 (2018) - Mehran Gholipour Shahraki, Saeed Ghorbanali:
The temperature and oxygen vacancy effects on the diffusion coefficient and ionic conductivity in ferroelectric BaTiO3 nanowires; A molecular dynamics study. Microelectron. Reliab. 82: 153-158 (2018) - Jing Wang, Yi-xi Cai, Xiao-hua Li, Yun-fei Shi, Ya-chao Bao, Jun Wang, Yun-xi Shi:
Experimental study on optical-thermal associated characteristics of LED car lamps under the action of ionic wind. Microelectron. Reliab. 82: 113-123 (2018) - Longjun Wang, Jiayou Xu, Gang Wang, Zheng Zhang:
Lifetime estimation of IGBT modules for MMC-HVDC application. Microelectron. Reliab. 82: 90-99 (2018) - Kazuki Watanabe, Yoshiharu Kariya, Naoyuki Yajima, Kizuku Obinata, Yoshiyuki Hiroshima, Shunichi Kikuchi, Akiko Matsui, Hiroshi Shimizu:
Low-cycle fatigue testing and thermal fatigue life prediction of electroplated copper thin film for through hole via. Microelectron. Reliab. 82: 20-27 (2018) - Jianqun Yang, Xingji Li, Chaoming Liu, Daniel M. Fleetwood:
The effect of ionization and displacement damage on minority carrier lifetime. Microelectron. Reliab. 82: 124-129 (2018) - Piotr Zachariasz, Agata Skwarek, Balázs Illés, Jan Zukrowski, Tamás Hurtony, Krzysztof Witek:
Mössbauer studies of β → α phase transition in Sn-rich solder alloys. Microelectron. Reliab. 82: 165-170 (2018) - Rongsheng Zhang, Liyi Xiao, Jie Li, Xuebing Cao, Chunhua Qi, Jiaqiang Li, Mingjiang Wang:
A fast fault injection platform of multiple SEUs for SRAM-based FPGAs. Microelectron. Reliab. 82: 147-152 (2018) - Yue Zhao, Guoyi Xu, Yunlong Sun, Boan Pan, Ting Li:
A portable high-density absolute-measure NIRS imager for detecting prefrontal lobe activity under fatigue driving. Microelectron. Reliab. 82: 197-203 (2018)
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