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"Humidity build-up in electronic enclosures exposed to different ..."

H. Conseil-Gudla et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.01.013

access: closed

type: Journal Article

metadata version: 2021-03-14

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H. Conseil-Gudla, Zygimantas Staliulionis, Sankhya Mohanty, Morten Stendahl Jellesen, Jesper Henri Hattel, Rajan Ambat:
Humidity build-up in electronic enclosures exposed to different geographical locations by RC modelling and reliability prediction. Microelectron. Reliab. 82: 136-146 (2018)

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