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"The effect of ionization and displacement damage on minority carrier lifetime."

Jianqun Yang et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.01.012

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/YangLLF18
Jianqun Yang, Xingji Li, Chaoming Liu, Daniel M. Fleetwood:
The effect of ionization and displacement damage on minority carrier lifetime. Microelectron. Reliab. 82: 124-129 (2018)

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