"A review of pulsed NBTI in P-channel power VDMOSFETs."

Danijel Dankovic et al. (2018)

Details and statistics

DOI: 10.1016/J.MICROREL.2018.01.003

access: closed

type: Journal Article

metadata version: 2024-02-05

a service of  Schloss Dagstuhl - Leibniz Center for Informatics