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"Topological variation on sub-20 nm double-gate inversion and ..."

S. Nilamani, P. Chitra, V. N. Ramakrishnan (2018)

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DOI: 10.1016/J.MICROREL.2018.01.002

access: closed

type: Journal Article

metadata version: 2020-02-22

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S. Nilamani, P. Chitra, V. N. Ramakrishnan:
Topological variation on sub-20 nm double-gate inversion and Junctionless-FinFET based 6T-SRAM circuits and its SEU radiation performance. Microelectron. Reliab. 82: 11-19 (2018)

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